Inventor · disambiguated record
Carl P. Babcock
Also filed as: BABCOCK CARL · BABCOCK CARL P
26 granted patents·1 pending application·721 citations·filing 1998–2007
97Inventor score
Top patents by PatentIndex Score
27 records- 0194US7080349B1Method of developing optimized optical proximity correction (OPC) fragmentation script for photolithographic processingADVANCED MICRO DEVICES INC·Filed 2004·Granted Jul 18, 2006·62 cites·20 claims
- 0293US7207017B1Method and system for metrology recipe generation and review and analysis of design, simulation and metrology resultsADVANCED MICRO DEVICES INC·Filed 2004·Granted Apr 17, 2007·85 cites·25 claims
- 0392US6335235B1Simplified method of patterning field dielectric regions in a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 1, 2002·145 cites·13 claims
- 0489US7194725B1System and method for design rule creation and selectionADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 20, 2007·57 cites·22 claims
- 0589US6902851B1Method for using phase-shifting maskADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 7, 2005·35 cites·23 claims
- 0689US6544699B1Method to improve accuracy of model-based optical proximity correctionADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 8, 2003·34 cites·20 claims
- 0788US7269804B2System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniquesADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 11, 2007·27 cites·15 claims
- 0887US6500587B1Binary and attenuating phase-shifting masks for multiple wavelengthsADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 31, 2002·27 cites·20 claims
- 0984US7281222B1System and method for automatic generation of optical proximity correction (OPC) rule setsADVANCED MICRO DEVICES INC·Filed 2004·Granted Oct 9, 2007·38 cites·16 claims
- 1082US7657864B2System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniquesGLOBALFOUNDRIES INC·Filed 2007·Granted Feb 2, 2010·5 cites·15 claims
- 1180US7313769B1Optimizing an integrated circuit layout by taking into consideration layout interactions as well as extra manufacturability marginADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 25, 2007·30 cites·20 claims
- 1279US6660459B2System and method for developing a photoresist layer with reduced pattern collapseADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 9, 2003·21 cites·18 claims
- 1379US6475811B1System for and method of using bacteria to aid in contact hole printingADVANCED MICRO DEVICES INC·Filed 2001·Granted Nov 5, 2002·22 cites·20 claims
- 1478US6630404B1Reducing feature dimension using self-assembled monolayerADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 7, 2003·20 cites·14 claims
- 1574US7422829B1Optical proximity correction (OPC) technique to compensate for flareADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 9, 2008·12 cites·20 claims
- 1673US7125652B2Immersion lithographic process using a conforming immersion mediumADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 24, 2006·11 cites·21 claims
- 1773US6423555B1System for determining overlay errorADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 23, 2002·16 cites·23 claims
- 1869US6645868B1Method of forming shallow trench isolation using antireflection layerADVANCED MICRO DEVICES INC·Filed 2001·Granted Nov 11, 2003·13 cites·14 claims
- 1968US6682988B1Growth of photoresist layer in photolithographic processADVANCED MICRO DEVICES INC·Filed 2002·Granted Jan 27, 2004·11 cites·20 claims
- 2066US6576536B1Ultra narrow lines for field effect transistorsADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 10, 2003·10 cites·20 claims
- 2163US6906777B1Pellicle for a lithographic lensADVANCED MICRO DEVICES INC·Filed 2004·Granted Jun 14, 2005·6 cites·21 claims
- 2260US7543256B1System and method for designing an integrated circuit deviceADVANCED MICRO DEVICES INC·Filed 2004·Granted Jun 2, 2009·6 cites·2 claims
- 2355US7061075B1Shallow trench isolation using antireflection layerADVANCED MICRO DEVICES INC·Filed 2004·Granted Jun 13, 2006·6 cites·18 claims
- 2454US6358843B1Method of making ultra small vias for integrated circuitsADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 19, 2002·4 cites·8 claims
- 2553US6821883B1Shallow trench isolation using antireflection layerADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 23, 2004·5 cites·18 claims
- 2649US6255717B1Shallow trench isolation using antireflection layerADVANCED MICRO DEVICES INC·Filed 1998·Granted Jul 3, 2001·13 cites·9 claims
- 2730US2002009845A1Simplified method of patterning field dielectric regions in a semiconductor deviceFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →