Inventor · disambiguated record
Carl Puehl, Iii
Also filed as: PUEHL CARL · PUEHL CARL W · PUEHL III CARL
0 granted patents·3 pending applications·0 citations·filing 2009–2016
Top patents by PatentIndex Score
3 records- 0151US2016320275A1Method for determining a concentration of metal impurities contaminating a silicon productHEMLOCK SEMICONDUCTOR CORP·Filed 2014·Application pending·0 cites
- 0239US2011228268A1Method Of Analyzing A Composition Containing ImpuritiesHADD JOHN·Filed 2009·Application pending·0 cites
- 0336US2017269004A1Low impurity detection method for characterizing metals within a surface and sub-surface of polycrystalline siliconHEMLOCK SEMICONDUCTOR CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →