Inventor · disambiguated record
Carlos Strocchia-Rivera
Also filed as: STROCCHIA-RIVERA CARLOS
12 granted patents·101 citations·filing 2000–2016
86Inventor score
Top patents by PatentIndex Score
12 records- 0191US6462817B1Method of monitoring ion implants by examination of an overlying masking materialFiled 2000·Granted Oct 8, 2002·93 cites·70 claims
- 0274US9224661B2Film thickness metrologyIBM·Filed 2014·Granted Dec 29, 2015·2 cites·9 claims
- 0373US9459226B2Lens coating/contamination electronic detectionIBM·Filed 2013·Granted Oct 4, 2016·2 cites·17 claims
- 0464US8037736B2Non-linearity determination of positioning scanner of measurement toolIBM·Filed 2008·Granted Oct 18, 2011·2 cites·7 claims
- 0559US7280209B2Method and apparatus for improved ellipsometric measurement of ultrathin filmsIBM·Filed 2004·Granted Oct 9, 2007·2 cites·7 claims
- 0658US7508511B2Method and apparatus for improved ellipsometric measurement of ultrathin filmsIBM·Filed 2008·Granted Mar 24, 2009·0 cites·8 claims
- 0755US7394539B2Method and apparatus for improved ellipsometric measurement of ultrathin filmsIBM·Filed 2007·Granted Jul 1, 2008·0 cites·15 claims
- 0853US9263348B2Film thickness metrologyIBM·Filed 2013·Granted Feb 16, 2016·0 cites·12 claims
- 0952US9831136B2Film thickness metrologyIBM·Filed 2015·Granted Nov 28, 2017·0 cites·14 claims
- 1045US9972548B2FinFET electrical characterization with enhanced hall effect and probeGLOBALFOUNDRIES INC·Filed 2016·Granted May 15, 2018·0 cites·20 claims
- 1145US8990961B2Non-linearity determination of positioning scanner of measurement toolBANKE JR GEORGE W·Filed 2011·Granted Mar 24, 2015·0 cites·11 claims
- 1241US9116038B2Integrated optical illumination reference sourceIBM·Filed 2013·Granted Aug 25, 2015·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →