Inventor · disambiguated record
Choel-Hwyi Bae
Also filed as: BAE CHOEL-HWYI
8 granted patents·1 pending application·118 citations·filing 2006–2013
85Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
Top patents by PatentIndex Score
9 records- 0195US7642106B2Methods for identifying an allowable process margin for integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jan 5, 2010·81 cites·16 claims
- 0286US9064732B2Semiconductor device including work function control film patterns and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jun 23, 2015·9 cites·14 claims
- 0383US7840917B2Method of correcting a design pattern for an integrated circuit and an apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 23, 2010·7 cites·23 claims
- 0474US7733099B2Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defectSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 8, 2010·6 cites·12 claims
- 0571US8941183B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jan 27, 2015·3 cites·19 claims
- 0670US7802210B2Methods and systems for analyzing layouts of semiconductor integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 21, 2010·9 cites·7 claims
- 0764US7705621B2Test pattern and method of monitoring defects using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 27, 2010·3 cites·7 claims
- 0838US7703055B2Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of holeSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 20, 2010·0 cites·20 claims
- 0938US2007118824A1Methods, systems, and computer program products for improving yield in integrated circuit device fabrication and related devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →