Inventor · disambiguated record
Chrysostomos Batistakis
Also filed as: BATISTAKIS CHRYSOSTOMOS
4 granted patents·8 pending applications·1 citations·filing 2018–2025
58Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0178US2025391010A1System and method for generating predictive images for wafer inspection using machine learningASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0271US11880640B2Systems and methods for predicting layer deformationASML NETHERLANDS BV·Filed 2023·Granted Jan 23, 2024·0 cites·20 claims
- 0366US11709988B2Method for predicting resist deformationASML NETHERLANDS BV·Filed 2019·Granted Jul 25, 2023·1 cites·20 claims
- 0465US2025103964A1Training a model to generate predictive dataASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0564US11914942B2Method for predicting resist deformationASML NETHERLANDS BV·Filed 2023·Granted Feb 27, 2024·0 cites·20 claims
- 0661US11625520B2Systems and methods for predicting layer deformationASML NETHERLANDS BV·Filed 2018·Granted Apr 11, 2023·0 cites·20 claims
- 0755US2025147436A1Methods of metrologyASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0855US2024369944A1Method for determining a stochastic metric relating to a lithographic processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0953US2025199419A1Methods of metrology and associated devicesASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1052US2024020961A1Machine learning based image generation of after-development or after-etch imagesASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1148US2023081821A1Method for predicting stochastic contributorsASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1243US2024062356A1Data-driven prediction and identification of failure modes based on wafer-level analysis and root cause analysis for semiconductor processingASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →