Inventor · disambiguated record
Charles C. Chiang
Also filed as: CHIANG CHARLES · CHIANG CHARLES C
31 granted patents·1 pending application·497 citations·filing 2004–2019
97Inventor score
Top patents by PatentIndex Score
32 records- 0198US7509622B2Dummy filling technique for improved planarization of chip surface topographySYNOPSYS INC·Filed 2006·Granted Mar 24, 2009·243 cites·29 claims
- 0290US8601419B1Accurate process hotspot detection using critical design rule extractionSYNOPSYS INC·Filed 2012·Granted Dec 3, 2013·27 cites·36 claims
- 0390US7703067B2Range pattern definition of susceptibility of layout regions to fabrication issuesSYNOPSYS INC·Filed 2006·Granted Apr 20, 2010·10 cites·24 claims
- 0490US7503029B2Identifying layout regions susceptible to fabrication issues by using range patternsSYNOPSYS INC·Filed 2006·Granted Mar 10, 2009·27 cites·23 claims
- 0589US11403564B2Lithographic hotspot detection using multiple machine learning kernelsSYNOPSYS INC·Filed 2019·Granted Aug 2, 2022·10 cites·20 claims
- 0688US8146032B2Method and apparatus for performing RLC modeling and extraction for three-dimensional integrated circuit (3D-IC) designsCHEN QIUSHI·Filed 2009·Granted Mar 27, 2012·37 cites·29 claims
- 0785US8490030B1Distance metric for accurate lithographic hotspot classification using radial and angular functionsCHIANG CHARLES C·Filed 2012·Granted Jul 16, 2013·14 cites·22 claims
- 0884US8006212B2Method and system for facilitating floorplanning for 3D ICSYNOPSYS INC·Filed 2008·Granted Aug 23, 2011·14 cites·30 claims
- 0983US8151236B2Steiner tree based approach for polygon fracturingSU QING·Filed 2008·Granted Apr 3, 2012·8 cites·38 claims
- 1082US7346865B2Fast evaluation of average critical area for IC layoutsSYNOPSYS INC·Filed 2004·Granted Mar 18, 2008·23 cites·27 claims
- 1180US9098649B2Distance metric for accurate lithographic hotspot classification using radial and angular functionsSYNOPSYS INC·Filed 2013·Granted Aug 4, 2015·5 cites·21 claims
- 1280US8635580B2Preconditioning for EDA cell libraryWANG XIN·Filed 2012·Granted Jan 21, 2014·4 cites·11 claims
- 1380US7707526B2Predicting IC manufacturing yield based on hotspotsSYNOPSYS INC·Filed 2007·Granted Apr 27, 2010·11 cites·31 claims
- 1478US7823099B2Lithography suspect spot location and scoring systemSYNOPSYS INC·Filed 2007·Granted Oct 26, 2010·9 cites·33 claims
- 1578US7289933B2Simulating topography of a conductive material in a semiconductor waferSYNOPSYS INC·Filed 2005·Granted Oct 30, 2007·10 cites·36 claims
- 1676US9594867B2DRC-based hotspot detection considering edge tolerance and incomplete specificationSYNOPSYS INC·Filed 2014·Granted Mar 14, 2017·4 cites·23 claims
- 1776US7543255B2Method and apparatus to reduce random yield lossSYNOPSYS INC·Filed 2007·Granted Jun 2, 2009·8 cites·13 claims
- 1875US8219941B2Range pattern definition of susceptibility of layout regions to fabrication issuesSINHA SUBARNAREKHA·Filed 2009·Granted Jul 10, 2012·6 cites·22 claims
- 1970US7644378B2Preconditioning for EDA cell librarySYNOPSYS INC·Filed 2004·Granted Jan 5, 2010·12 cites·14 claims
- 2067US7962873B2Fast evaluation of average critical area for ic layoutsSYNOPSYS INC·Filed 2008·Granted Jun 14, 2011·2 cites·15 claims
- 2166US8000826B2Predicting IC manufacturing yield by considering both systematic and random intra-die process variationsSYNOPSYS INC·Filed 2006·Granted Aug 16, 2011·4 cites·18 claims
- 2265US8209639B2Identifying layout regions susceptible to fabrication issues by using range patternsSINHA SUBARNAREKHA·Filed 2009·Granted Jun 26, 2012·3 cites·21 claims
- 2363US8141007B2Method and apparatus for identifying and correcting phase conflictsSINHA SUBARNAREKHA·Filed 2009·Granted Mar 20, 2012·1 cites·14 claims
- 2461US8205185B2Fast evaluation of average critical area for IC layoutsSU QING·Filed 2009·Granted Jun 19, 2012·1 cites·14 claims
- 2561US8205179B2Fast evaluation of average critical area for IC layoutsSU QING·Filed 2009·Granted Jun 19, 2012·1 cites·21 claims
- 2661US7962882B2Fast evaluation of average critical area for IC layoutsSYNOPSYS INC·Filed 2008·Granted Jun 14, 2011·1 cites·14 claims
- 2756US8286121B2Preconditioning for EDA cell libraryWANG XIN·Filed 2009·Granted Oct 9, 2012·0 cites·5 claims
- 2855US8176456B2Method and apparatus for computing dummy feature density for chemical-mechanical polishingWANG XIN·Filed 2008·Granted May 8, 2012·0 cites·15 claims
- 2954US8452075B2Range pattern matching for hotspots containing vias and incompletely specified range patternsXU JINGYU·Filed 2007·Granted May 28, 2013·2 cites·12 claims
- 3049US7594213B2Method and apparatus for computing dummy feature density for chemical-mechanical polishingSYNOPSYS INC·Filed 2004·Granted Sep 22, 2009·0 cites·21 claims
- 3149US7496883B2Method and apparatus for identifying and correcting phase conflictsSYNOPSYS INC·Filed 2005·Granted Feb 24, 2009·0 cites·7 claims
- 3246US2014358830A1Lithographic hotspot detection using multiple machine learning kernelsSYNOPSYS INC·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →