Inventor · disambiguated record
Chris Ellingham
Also filed as: ELLINGHAM CHRIS
3 granted patents·371 citations·filing 1995–1999
80Inventor score
Files withSYNOPSYS INC3
Top patents by PatentIndex Score
3 records- 0193US6106568AHierarchical scan architecture for design for test applicationsSYNOPSYS INC·Filed 1999·Granted Aug 22, 2000·120 cites·20 claims
- 0289US5949692AHierarchical scan architecture for design for test applicationsSYNOPSYS INC·Filed 1996·Granted Sep 7, 1999·89 cites·25 claims
- 0387US5903466AConstraint driven insertion of scan logic for implementing design for test within an integrated circuit designSYNOPSYS INC·Filed 1995·Granted May 11, 1999·162 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →