Inventor · disambiguated record
Chris Haidinyak
Also filed as: HAIDINYAK CHRIS
9 granted patents·236 citations·filing 2002–2007
90Inventor score
Top patents by PatentIndex Score
9 records- 0193US7207017B1Method and system for metrology recipe generation and review and analysis of design, simulation and metrology resultsADVANCED MICRO DEVICES INC·Filed 2004·Granted Apr 17, 2007·85 cites·25 claims
- 0289US7194725B1System and method for design rule creation and selectionADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 20, 2007·57 cites·22 claims
- 0388US7269804B2System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniquesADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 11, 2007·27 cites·15 claims
- 0482US7875851B1Advanced process control framework using two-dimensional image analysisADVANCED MICRO DEVICES INC·Filed 2006·Granted Jan 25, 2011·9 cites·20 claims
- 0582US7657864B2System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniquesGLOBALFOUNDRIES INC·Filed 2007·Granted Feb 2, 2010·5 cites·15 claims
- 0680US7313769B1Optimizing an integrated circuit layout by taking into consideration layout interactions as well as extra manufacturability marginADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 25, 2007·30 cites·20 claims
- 0770US6982136B1Method and system for determining optimum optical proximity corrections within a photolithography systemADVANCED MICRO DEVICES INC·Filed 2004·Granted Jan 3, 2006·9 cites·12 claims
- 0867US6824937B1Method and system for determining optimum optical proximity corrections within a photolithography systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 30, 2004·8 cites·14 claims
- 0960US7543256B1System and method for designing an integrated circuit deviceADVANCED MICRO DEVICES INC·Filed 2004·Granted Jun 2, 2009·6 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when Chris Haidinyak files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →