Inventor · disambiguated record
Chia-Tong Ho
Also filed as: HO CHIA-TONG
11 granted patents·26 citations·filing 2003–2013
86Inventor score
Files withTAIWAN SEMICONDUCTOR MFG3TSAI PO-FENG3CHEN JUI-LONG2TAIWAN SEMICONDUCTOR MFG CO LTD2HO CHIA-TONG1
Top patents by PatentIndex Score
11 records- 0184US8606387B2Adaptive and automatic determination of system parametersTSAI PO-FENG·Filed 2011·Granted Dec 10, 2013·6 cites·20 claims
- 0279US9519285B2Systems and associated methods for tuning processing toolsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Dec 13, 2016·4 cites·20 claims
- 0377US8942840B2Auto device skew manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 27, 2015·3 cites·20 claims
- 0473US8406912B2System and method for data mining and feature tracking for fab-wide prediction and controlCHEN JUI-LONG·Filed 2010·Granted Mar 26, 2013·3 cites·17 claims
- 0570US9870896B2System and method for controlling ion implanterTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jan 16, 2018·2 cites·20 claims
- 0669US9349660B2Integrated circuit manufacturing tool condition monitoring system and methodTSAI PO-FENG·Filed 2011·Granted May 24, 2016·2 cites·20 claims
- 0768US9727049B2Qualitative fault detection and classification system for tool condition monitoring and associated methodsHO CHIA-TONG·Filed 2012·Granted Aug 8, 2017·3 cites·19 claims
- 0866US9141097B2Adaptive and automatic determination of system parametersTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Sep 22, 2015·1 cites·20 claims
- 0966US8391999B2Auto device skew manufacturingCHEN JUI-LONG·Filed 2010·Granted Mar 5, 2013·2 cites·20 claims
- 1042US10047439B2Method and system for tool condition monitoring based on a simulated inline measurementTSAI PO FENG·Filed 2011·Granted Aug 14, 2018·0 cites·20 claims
- 1133US7101758B2Poly-etching method for split gate flash memory cellTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Sep 5, 2006·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →