Inventor · disambiguated record
Chian-Min Richard Ho
Also filed as: HO CHIAN-MIN RICHARD
21 granted patents·5 pending applications·533 citations·filing 1997–2025
96Inventor score
Files withGOOGLE LLC13MENTOR GRAPHICS CORP5LEVITT JEREMY RUTLEDGE2O IN DESIGN AUTOMATION2HO CHIAN-MIN RICHARD1
Top patents by PatentIndex Score
26 records- 0195US11100266B2Generating integrated circuit floorplans using neural networksGOOGLE LLC·Filed 2020·Granted Aug 24, 2021·5 cites·40 claims
- 0294US10699043B2Generating integrated circuit floorplans using neural networksGOOGLE LLC·Filed 2019·Granted Jun 30, 2020·15 cites·27 claims
- 0393US6848088B1Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2002·Granted Jan 25, 2005·69 cites·10 claims
- 0490US6885983B1Method for automatically searching for functional defects in a description of a circuitMENTOR GRAPHICS CORP·Filed 2001·Granted Apr 26, 2005·42 cites·68 claims
- 0589US7478028B2Method for automatically searching for functional defects in a description of a circuitHO CHIAN-MIN RICHARD·Filed 2005·Granted Jan 13, 2009·21 cites·18 claims
- 0689US6609229B1Method for automatically generating checkers for finding functional defects in a description of a circuitO IN DESIGN AUTOMATION INC·Filed 2000·Granted Aug 19, 2003·71 cites·122 claims
- 0789US6292765B1Method for automatically searching for functional defects in a description of a circuitO IN DESIGN AUTOMATION·Filed 1997·Granted Sep 18, 2001·67 cites·37 claims
- 0888US6175946B1Method for automatically generating checkers for finding functional defects in a description of a circuitO IN DESIGN AUTOMATION·Filed 1997·Granted Jan 16, 2001·130 cites·20 claims
- 0986US11556690B2Generating integrated circuit placements using neural networksGOOGLE LLC·Filed 2021·Granted Jan 17, 2023·1 cites·20 claims
- 1086US7890897B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2007·Granted Feb 15, 2011·11 cites·23 claims
- 1185US8418121B2Measure of analysis performed in property checkingLEVITT JEREMY RUTLEDGE·Filed 2011·Granted Apr 9, 2013·7 cites·21 claims
- 1285US7454324B1Selection of initial states for formal verificationSEAWRIGHT JAMES ANDREW GARRARD·Filed 2003·Granted Nov 18, 2008·57 cites·18 claims
- 1383US2025053714A1Generating integrated circuit floorplans using neural networksGOOGLE LLC·Filed 2024·Application pending·0 cites
- 1481US12248745B2Generating integrated circuit placements using neural networksGOOGLE LLC·Filed 2023·Granted Mar 11, 2025·0 cites·20 claims
- 1578US12086516B2Generating integrated circuit floorplans using neural networksGOOGLE LLC·Filed 2023·Granted Sep 10, 2024·0 cites·18 claims
- 1678US2025291991A1Generating integrated circuit placements using neural networksGOOGLE LLC·Filed 2025·Application pending·0 cites
- 1777US11853677B2Generating integrated circuit placements using neural networksGOOGLE LLC·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1877US7007249B2Method for automatically generating checkers for finding functional defects in a description of circuitLY TAI AN·Filed 2003·Granted Feb 28, 2006·21 cites·15 claims
- 1975US7318205B2Measure of analysis performed in property checkingLEVITT JEREMY RUTLEDGE·Filed 2004·Granted Jan 8, 2008·15 cites·26 claims
- 2071US11675940B2Generating integrated circuit floorplans using neural networksGOOGLE LLC·Filed 2021·Granted Jun 13, 2023·0 cites·20 claims
- 2171US11216609B2Generating integrated circuit placements using neural networksGOOGLE LLC·Filed 2021·Granted Jan 4, 2022·0 cites·27 claims
- 2268US9262557B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2013·Granted Feb 16, 2016·1 cites·5 claims
- 2357US9684760B2Measure of analysis performed in property checkingMENTOR GRAPHICS CORP·Filed 2016·Granted Jun 20, 2017·0 cites·18 claims
- 2453US2024273270A1Generating learned representations of digital circuit designsGOOGLE LLC·Filed 2022·Application pending·0 cites
- 2552US2025165689A1Adaptive test generation for functional coverage closureGOOGLE LLC·Filed 2023·Application pending·0 cites
- 2641US2023376645A1Faster Coverage Convergence with Automatic Test Parameter Tuning in Constrained Random VerificationGOOGLE LLC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →