Inventor · disambiguated record
Chang-Young Hong
Also filed as: HONG CHANG Y · HONG CHANG YOUNG
10 granted patents·2 pending applications·33 citations·filing 2004–2016
84Inventor score
Files withROHM & HAAS ELECT MATERIALS KOREA LTD5DONGBU ELECTRONICS CO LTD2DONGBU HITEK CO LTD1DONGBU HITEK LTD CO1DONGBUANAM SEMICONDUCTOR INC1
Top patents by PatentIndex Score
12 records- 0186US10564542B2Photoresist compositions and methodsROHM & HAAS ELECT MATERIALS KOREA LTD·Filed 2016·Granted Feb 18, 2020·4 cites·11 claims
- 0286US7315359B2Method for monitoring micro-lens curvature in-lineDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jan 1, 2008·16 cites·19 claims
- 0382US7364936B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Apr 29, 2008·7 cites·7 claims
- 0473US9753370B2Multiple-pattern forming methodsROHM & HAAS ELECT MAT·Filed 2015·Granted Sep 5, 2017·2 cites·13 claims
- 0568US7681519B2Apparatus for coating a photoresist layerDONGBU HITEK LTD CO·Filed 2006·Granted Mar 23, 2010·3 cites·11 claims
- 0667US10514604B2Overcoat compositions and methods for photolithographyROHM & HAAS ELECT MATERIALS KOREA LTD·Filed 2016·Granted Dec 24, 2019·1 cites·18 claims
- 0756US11016388B2Overcoat compositions and methods for photolithographyROHM & HAAS ELECT MATERIALS KOREA LTD·Filed 2016·Granted May 25, 2021·0 cites·8 claims
- 0854US2008258249A1CMOS image sensor and method for fabricating the sameHONG CHANG YOUNG·Filed 2008·Application pending·0 cites
- 0945US10503073B2Photoresist compositions and methodsROHM & HAAS ELECT MATERIALS KOREA LTD·Filed 2016·Granted Dec 10, 2019·0 cites·15 claims
- 1043US7517770B2Method for forming metal line and semiconductor device including the sameDONGBU HITEK CO LTD·Filed 2006·Granted Apr 14, 2009·0 cites·19 claims
- 1142US10274824B2Photobase generators and photoresist compositions comprising sameROHM & HAAS ELECT MATERIALS KOREA LTD·Filed 2016·Granted Apr 30, 2019·0 cites·14 claims
- 1239US2005141104A1Image sensorDONGBUANAM SEMICONDUCTOR INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →