Inventor · disambiguated record
Chyei-Jer Hsieh
Also filed as: HSIEH CHYEI-JER
3 granted patents·1 pending application·90 citations·filing 1998–2003
70Inventor score
Files withVANGUARD INT SEMICONDUCT CORP4
Top patents by PatentIndex Score
4 records- 0189US6645869B1Etching back process to improve topographic planarization of a polysilicon layerVANGUARD INT SEMICONDUCT CORP·Filed 2002·Granted Nov 11, 2003·84 cites·6 claims
- 0238US6762096B1Method for forming a polysilicon spacer with a vertical profileVANGUARD INT SEMICONDUCT CORP·Filed 2003·Granted Jul 13, 2004·3 cites·9 claims
- 0332US2003054608A1Method for forming shallow trench isolation in semiconductor deviceVANGUARD INT SEMICONDUCT CORP·Filed 2001·Application pending·0 cites
- 0430US6057246AMethod for etching a metal layer with dimensional controlVANGUARD INT SEMICONDUCT CORP·Filed 1998·Granted May 2, 2000·3 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →