Inventor · disambiguated record
Chin-Jung Hsu
Also filed as: HSU CHIN-JUNG
3 granted patents·2 pending applications·95 citations·filing 1997–2024
75Inventor score
Top patents by PatentIndex Score
5 records- 0175US6643006B1Method and system for reviewing a semiconductor wafer using at least one defect sampling conditionINSPEX INC·Filed 2001·Granted Nov 4, 2003·18 cites·28 claims
- 0273US6842866B2Method and system for analyzing bitmap test dataFiled 2002·Granted Jan 11, 2005·31 cites·20 claims
- 0372US6028664AMethod and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanismsINSPEX INC·Filed 1997·Granted Feb 22, 2000·46 cites·11 claims
- 0455US2024418910A1Lens module with integrated structurePLATINUM OPTICS TECH INC·Filed 2024·Application pending·0 cites
- 0539US2016001785A1Motion sensing system and methodHSU CHIN-JUNG·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →