Inventor · disambiguated record
Chia-Wei Huang
Also filed as: HUANG CHIA-WEI
52 granted patents·11 pending applications·168 citations·filing 2006–2025
97Inventor score
Files withUNITED MICROELECTRONICS CORP33TAIWAN SEMICONDUCTOR MFG CO LTD5VIA TECH INC4APEX MEDICAL CORP3QUANTA COMP INC3
Top patents by PatentIndex Score
63 records- 0196US10785158B1System and method for provisioning both IPV4 and IPV6 internet service and load balancer serviceCHUNGHWA TELECOM CO LTD·Filed 2019·Granted Sep 22, 2020·19 cites·20 claims
- 0295US8486587B2Method for correcting layout pattern and method for manufacturing photomaskTSAI CHEN-HUA·Filed 2011·Granted Jul 16, 2013·14 cites·19 claims
- 0394US9958912B2Two rack unit chassis and low profile tool-less hard drive carrierQUANTA COMP INC·Filed 2016·Granted May 1, 2018·17 cites·19 claims
- 0494US9698047B2Dummy gate technology to avoid shorting circuitUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 4, 2017·12 cites·12 claims
- 0594US8782572B1Method of optical proximity correctionUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 15, 2014·9 cites·8 claims
- 0690US10109720B1Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 23, 2018·6 cites·18 claims
- 0789US10446663B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 15, 2019·5 cites·11 claims
- 0889US9786647B1Semiconductor layout structureUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 10, 2017·7 cites·9 claims
- 0988US2025366086A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 1087US9524361B2Method for decomposing a layout of an integrated circuitUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 20, 2016·6 cites·12 claims
- 1186US8748066B2Method for forming photomasksUNITED MICROELECTRONICS CORP·Filed 2012·Granted Jun 10, 2014·4 cites·19 claims
- 1285USD907047SCase with keyboardKAO HSING YI·Filed 2019·Granted Jan 5, 2021·23 cites·1 claims
- 1383US10139723B2Method of forming photomaskUNITED MICROELECTRONICS CORP·Filed 2016·Granted Nov 27, 2018·4 cites·16 claims
- 1482US10026726B2Dummy gate technology to avoid shorting circuitUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jul 17, 2018·3 cites·5 claims
- 1579US8598712B2Semiconductor structure formed by double patterning techniqueHUANG CHIA-WEI·Filed 2011·Granted Dec 3, 2013·4 cites·6 claims
- 1678US12408393B2Semiconductor device with a single diffusion break structure and a gate structure having aligned sidewallsUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 2, 2025·0 cites·8 claims
- 1778US12278265B2Method for fabricating a fin with minimal length between two single-diffusion break (SDB) trenchesUNITED MICROELECTRONICS CORP·Filed 2023·Granted Apr 15, 2025·0 cites·10 claims
- 1878US10487922B2Horizontal motion mechanism in limited spaceQUANTA COMP INC·Filed 2018·Granted Nov 26, 2019·2 cites·18 claims
- 1978US7669153B2Method for correcting photomask patternUNITED MICROELECTRONICS CORP·Filed 2007·Granted Feb 23, 2010·5 cites·13 claims
- 2077US9613969B2Semiconductor structure and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 4, 2017·2 cites·6 claims
- 2175US8741507B1Method for separating photomask patternUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 3, 2014·2 cites·9 claims
- 2275US2025385741A1Impedance calibration method of radio frequency transmitter and associated electronic deviceREALTEK SEMICONDUCTOR CORP·Filed 2025·Application pending·0 cites
- 2373US9208276B1Method for generating layout patternUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 8, 2015·1 cites·9 claims
- 2473US8966410B2Semiconductor structure and method for fabricating semiconductor layoutUNITED MICROELECTRONICS CORP·Filed 2013·Granted Feb 24, 2015·2 cites·31 claims
- 2572US10424894B2Passively Q-switched fiber laser system and method for fabricating a saturable absorber of the systemUNIV NAT TAIPEI TECHNOLOGY·Filed 2017·Granted Sep 24, 2019·2 cites·5 claims
- 2670US9316901B2Method for forming patternsUNITED MICROELECTRONICS CORP·Filed 2014·Granted Apr 19, 2016·1 cites·19 claims
- 2770US2024288489A1Test circuit and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2869US10605855B2Method, test line and system for detecting semiconductor wafer defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Mar 31, 2020·2 cites·20 claims
- 2968US12394938B2Force saving mechanism for circuit board installationQUANTA COMP INC·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 3068US11715759B2Semiconductor device with a single diffusion break structure having a sidewall aligned with a gate sidewallUNITED MICROELECTRONICS CORP·Filed 2020·Granted Aug 1, 2023·0 cites·9 claims
- 3167US9196352B2Static random access memory unit cell structure and static random access memory unit cell layout structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 24, 2015·2 cites·18 claims
- 3267US2025298318A1Localized coating of functional filmAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 3366US11819614B2Patient interface having adaptive system, respiratory mask and cushion module adapted with adaptive systemAPEX MEDICAL CORP·Filed 2019·Granted Nov 21, 2023·1 cites·29 claims
- 3466US9627036B2Static random access memory layout structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 18, 2017·2 cites·10 claims
- 3566US2025284200A1Diffuser-less gray-tone lithography process, mask design, and fabrication methodAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 3664US12007431B2Test circuit and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 11, 2024·0 cites·20 claims
- 3764US7913196B2Method of verifying a layout patternUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 22, 2011·3 cites·28 claims
- 3863US8423923B2Optical proximity correction methodHUANG CHIA-WEI·Filed 2011·Granted Apr 16, 2013·1 cites·12 claims
- 3962US12395253B2Transmitter and power calibration methodREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 4060US9368365B1Method for forming a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 14, 2016·1 cites·10 claims
- 4156US7886254B2Method for amending layout patternsUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 8, 2011·1 cites·28 claims
- 4255US9141744B2Method for generating layout patternUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 22, 2015·0 cites·9 claims
- 4354US11839516B2Medical imaging equipment and medical imaging methodCORETRONIC CORP·Filed 2021·Granted Dec 12, 2023·0 cites·19 claims
- 4454US2024162038A1Photomask structure, semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 4553US2025314692A1Testing apparatus and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 4651US9859170B2Method of forming semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 2, 2018·0 cites·13 claims
- 4748US11754614B2Semiconductor device and analyzing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 12, 2023·0 cites·20 claims
- 4846US11710345B2Driver login systemVIA TECH INC·Filed 2021·Granted Jul 25, 2023·0 cites·19 claims
- 4946US10444622B2Method for generating masks for manufacturing of a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 15, 2019·0 cites·7 claims
- 5046US9274416B2Method for forming photo-mask and OPC methodUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 1, 2016·0 cites·10 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →