Inventor · disambiguated record
Chu Pang Huang
Also filed as: HUANG CHU PANG
4 granted patents·9 citations·filing 2010–2011
67Inventor score
Technology areasG11C
Top patents by PatentIndex Score
4 records- 0162US8605525B2System and method for testing for defects in a semiconductor memory arrayHUANG YIN CHIN·Filed 2010·Granted Dec 10, 2013·4 cites·5 claims
- 0253US8351286B2Test method for screening manufacturing defects in a memory arrayMACRONIX INT CO LTD·Filed 2010·Granted Jan 8, 2013·2 cites·15 claims
- 0350US8504883B2System and method for testing integrated circuitsHUANG YIN-CHIN·Filed 2010·Granted Aug 6, 2013·2 cites·18 claims
- 0443US8498168B2Test method for screening local bit-line defects in a memory arrayHUANG YIN CHIN·Filed 2011·Granted Jul 30, 2013·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →