Inventor · disambiguated record
Chuong Huynh
Also filed as: HUYNH CHUONG · HUYNH CHUONG LE
7 granted patents·5 pending applications·25 citations·filing 2015–2025
80Inventor score
Top patents by PatentIndex Score
12 records- 0178US2025357165A1Methods of cross-section imaging of an inspection volume in a waferZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0264US10410828B2Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Sep 10, 2019·1 cites·22 claims
- 0361US2025266240A1Editing of deep, multi-layered structuresZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0460US11848172B2Method for measuring a sample and microscope implementing the methodZEISS CARL SMT GMBH·Filed 2021·Granted Dec 19, 2023·0 cites·25 claims
- 0558US12056865B2Wafer-tilt determination for slice-and-image processZEISS CARL SMT GMBH·Filed 2021·Granted Aug 6, 2024·0 cites·25 claims
- 0658US2024331179A13d volume inspection of semiconductor wafers with increased accuracyZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0757USD840641SCapPUBLISH BRAND INC·Filed 2016·Granted Feb 19, 2019·8 cites·1 claims
- 0853USD807615SPantsPUBLISH BRAND INC·Filed 2015·Granted Jan 16, 2018·8 cites·1 claims
- 0953US2019189392A1Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2019·Application pending·0 cites
- 1044USD815799SPantsPUBLISH BRAND INC·Filed 2015·Granted Apr 24, 2018·5 cites·1 claims
- 1143US2019231014A1Cap with unique profilePUBLISH BRAND INC·Filed 2018·Application pending·0 cites
- 1237USD815800SPantsPUBLISH BRAND INC·Filed 2015·Granted Apr 24, 2018·3 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when Chuong Huynh files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →