Inventor · disambiguated record
Chih-Yu Jen
Also filed as: JEN CHIH-YU
5 granted patents·4 pending applications·5 citations·filing 2013–2023
66Inventor score
Top patents by PatentIndex Score
9 records- 0179US9599555B2Doping profile measurement using terahertz time domain spectroscopy (THz-TDS)RICHTER CHRISTIAAN·Filed 2015·Granted Mar 21, 2017·5 cites·21 claims
- 0267US11651935B2Time-dependent defect inspection apparatusASML NETHERLANDS BV·Filed 2021·Granted May 16, 2023·0 cites·16 claims
- 0366US12469674B2Photo-electrical evolution defect inspectionASML NETHERLANDS BV·Filed 2020·Granted Nov 11, 2025·0 cites·17 claims
- 0458US11056311B2Time-dependent defect inspection apparatusASML NETHERLANDS BV·Filed 2019·Granted Jul 6, 2021·0 cites·14 claims
- 0551US2025166161A1Methods and systems for improving wafer defect classification nuisance rateASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0649US2023298851A1Systems and methods for signal electron detection in an inspection apparatusASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 0749US2025265701A1Transient defect inspection using an inspection imageASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0849US2013247976A1Solar cellLI AWANKANA·Filed 2013·Application pending·0 cites
- 0948US11175248B2Apparatus and method for detecting time-dependent defects in a fast-charging deviceASML NETHERLANDS BV·Filed 2019·Granted Nov 16, 2021·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →