Inventor · disambiguated record
Chan-Hee Jeon
Also filed as: JEON CHAN · JEON CHAN-HEE
9 granted patents·4 pending applications·19 citations·filing 2005–2023
82Inventor score
Top patents by PatentIndex Score
13 records- 0173US7888739B2Electrostatic discharge circuit and method of dissipating an electrostatic currentSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 15, 2011·5 cites·20 claims
- 0273US7417282B2Vertical double-diffused metal oxide semiconductor (VDMOS) device incorporating reverse diodeSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Aug 26, 2008·6 cites·17 claims
- 0364US8358490B2Transistor with EOS protection and ESD protection circuit including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jan 22, 2013·3 cites·16 claims
- 0459US9620502B2Semiconductor device including an extended impurity regionJEON CHAN-HEE·Filed 2014·Granted Apr 11, 2017·1 cites·23 claims
- 0553US8705219B2Electrostatic discharge protection circuitSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Apr 22, 2014·1 cites·20 claims
- 0652US7907373B2Electrostatic discharge circuitSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 15, 2011·3 cites·30 claims
- 0751US10020231B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 10, 2018·0 cites·10 claims
- 0851US2024001408A1Apparatus for manufacturing semiconductor device and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0939US7696626B2Semiconductor device and method of arranging pad thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 13, 2010·0 cites·20 claims
- 1039US2014332883A1Semiconductor Device Having Dummy Gate and GateSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1134US2006258067A1Device for protecting against electrostatic dischargeSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1234US2010254051A1Overvoltage Protection Circuits that Inhibit Electrostatic Discharge (ESD) and Electrical Overstress (EOS) Events from Damaging Integrated Circuit DevicesJEON CHAN-HEE·Filed 2009·Application pending·0 cites
- 1326US8427795B2Pad interface circuit and method of improving reliability of the pad interface circuitJEON CHAN-HEE·Filed 2010·Granted Apr 23, 2013·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Chan-Hee Jeon files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →