Inventor · disambiguated record

Ching-Hung Kao

Also filed as: KAO CHING-HUNG

88 granted patents·33 pending applications·236 citations·filing 2004–2025

99Inventor score

Technology areasH10D H10W H10F H10P H01L

Files withTAIWAN SEMICONDUCTOR MFG CO LTD58 UNITED MICROELECTRONICS CORP40 KAO CHING-HUNG22 UNITED MICROELETRONICS CORP1

Top patents by PatentIndex Score

121 records

0196US11784198B2Wide channel semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 10, 2023·2 cites·20 claims
0295US10566361B2Wide channel gate structure and method of formingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Feb 18, 2020·8 cites·20 claims
0392US11342455B2Minimization of silicon germanium facets in planar metal oxide semiconductor structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 24, 2022·4 cites·20 claims
0492US7498190B2Method for fabricating a CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 3, 2009·17 cites·20 claims
0592US2025366089A1Circuit Structure and Method for Reducing Electronic NoisesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
0691US9537040B2Complementary metal-oxide-semiconductor image sensor and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jan 3, 2017·7 cites·8 claims
0791US8779539B2Image sensor and method for fabricating the sameKAO CHING-HUNG·Filed 2011·Granted Jul 15, 2014·8 cites·7 claims
0891US7408211B2Transfer transistor of CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2006·Granted Aug 5, 2008·16 cites·20 claims
0989US10658455B2Metal insulator metal capacitor structure having high capacitanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 19, 2020·7 cites·20 claims
1089US8921901B1Stacked CMOS image sensor and signal processor wafer structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Dec 30, 2014·10 cites·11 claims
1188US8779344B2Image sensor including a deep trench isolation (DTI)that does not contact a connecting element physicallyKAO CHING-HUNG·Filed 2012·Granted Jul 15, 2014·5 cites·18 claims
1288US7517761B2Method for manufacturing semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2007·Granted Apr 14, 2009·21 cites·11 claims
1387US8334189B2Method for forming trenches and trench isolation on a substrateKAO CHING-HUNG·Filed 2011·Granted Dec 18, 2012·9 cites·14 claims
1486US8643101B2High voltage metal oxide semiconductor device having a multi-segment isolation structureKAO CHING-HUNG·Filed 2011·Granted Feb 4, 2014·11 cites·16 claims
1586US7741662B2Ultra high voltage MOS transistor deviceUNITED MICROELECTRONICS CORP·Filed 2008·Granted Jun 22, 2010·11 cites·18 claims
1686US7531374B2CMOS image sensor process and structureUNITED MICROELECTRONICS CORP·Filed 2006·Granted May 12, 2009·7 cites·11 claims
1785US12362184B2Semiconductor devices and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jul 15, 2025·0 cites·20 claims
1885US8383448B2Method of fabricating metal oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2012·Granted Feb 26, 2013·3 cites·8 claims
1985US2025365991A1Metal insulator metal capacitor structure having high capacitanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
2084US12457816B2Wide channel semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
2184US2025323042A1Semiconductor devices and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
2283US9997628B1Semiconductor device and method of fabricating thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 12, 2018·4 cites·20 claims
2382US12464735B2Metal insulator metal capacitor structure having high capacitanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Nov 4, 2025·0 cites·20 claims
2482US10020265B2Semiconductor structure and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 10, 2018·2 cites·20 claims
2582US7868394B2Metal-oxide-semiconductor transistor and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jan 11, 2011·8 cites·16 claims
2681US12464787B2Circuit structure and method for reducing electronic noisesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Nov 4, 2025·0 cites·20 claims
2780US12354959B2Redistribution layer featuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 8, 2025·0 cites·20 claims
2880US11901305B2Method for fabricating semiconductor structure having alignment mark featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
2980US7378327B2Method for fabricating a junction varactor with high Q factorUNITED MICROELECTRONICS CORP·Filed 2007·Granted May 27, 2008·7 cites·8 claims
3079US2024387380A1Redistribution layer featuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
3178US7535063B2ESD protection device structureUNITED MICROELECTRONICS CORP·Filed 2005·Granted May 19, 2009·6 cites·9 claims
3277US10804211B2Semiconductor structure and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 13, 2020·1 cites·20 claims
3377US9093296B2LDMOS transistor having trench structures extending to a buried layerKAO CHING-HUNG·Filed 2012·Granted Jul 28, 2015·3 cites·8 claims
3476US9312292B2Back side illumination image sensor and manufacturing method thereofKAO CHING-HUNG·Filed 2011·Granted Apr 12, 2016·1 cites·8 claims
3576US2024387605A1Semiconductor structure and method of manufactureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
3676US2024395743A1Semiconductor device and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
3775US7361955B2High-voltage MOS device with dummy diffusion regionUNITED MICROELECTRONICS CORP·Filed 2005·Granted Apr 22, 2008·6 cites·10 claims
3875US7169680B2Method for fabricating a metal-insulator-metal capacitorUNITED MICROELECTRONICS CORP·Filed 2005·Granted Jan 30, 2007·7 cites·17 claims
3975US2024389314A1Flash memory layout to eliminate floating gate bridgeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
4075US2024395876A1Method of manufacturing a semiconductor device and a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
4175US2024387689A1Semiconductor devices and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
4274US12020940B2Semiconductor devices and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 25, 2024·0 cites·20 claims
4374US10115758B2Isolation structure for reducing crosstalk between pixels and fabrication method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 30, 2018·2 cites·20 claims
4474US2024363752A1Minimization of silicon germanium facets in planar metal oxide semiconductor structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
4573US12274054B2Flash memory layout to eliminate floating gate bridgeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
4673US12068364B2Metal insulator metal capacitor structure having high capacitanceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 20, 2024·0 cites·20 claims
4773US11362039B2Semiconductor structure and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 14, 2022·0 cites·20 claims
4873US7939867B2Complementary metal-oxide-semiconductor (CMOS) image sensor and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2008·Granted May 10, 2011·2 cites·9 claims
4973US7924504B2Color filter structure having inorganic layersUNITED MICROELECTRONICS CORP·Filed 2008·Granted Apr 12, 2011·6 cites·4 claims
5073US7510899B2Methods for fabricating a CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 31, 2009·2 cites·5 claims

Showing the top 50 of 121 patent records by PatentIndex Score.

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →