Inventor · disambiguated record

Chien-Wen Lai

Also filed as: LAI CHIEN-WEN

52 granted patents·17 pending applications·113 citations·filing 2000–2025

97Inventor score

Technology areasH10P G03F G06F H10W G01S

Files withTAIWAN SEMICONDUCTOR MFG CO LTD43 HENGHAO TECHNOLOGY CO LTD7 TAIWAN SEMICONDUCTOR MFG5 UNITED MICROELECTRONICS CORP5 MAGNA ELECTRONICS INC2

Top patents by PatentIndex Score

69 records

0197US9870443B2Method and apparatus for integrated circuit mask patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 16, 2018·26 cites·20 claims
0293US11715638B2Method for forming semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 1, 2023·2 cites·20 claims
0390US11322362B2Landing metal etch process for improved overlay controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 3, 2022·4 cites·20 claims
0489US11289332B2Directional processing to remove a layer or a material formed over a substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 29, 2022·4 cites·20 claims
0589US10354874B2Directional processing to remove a layer or a material formed over a substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 16, 2019·4 cites·20 claims
0688US11275175B2Method for detecting objects via a vehicular sensing systemMAGNA ELECTRONICS INC·Filed 2020·Granted Mar 15, 2022·2 cites·36 claims
0788US10504775B1Methods of forming metal layer structures in semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 10, 2019·4 cites·20 claims
0887US11699589B2Method for forming patterned mask layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 11, 2023·1 cites·20 claims
0983US12014926B2Self aligned litho etch process patterning methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 18, 2024·0 cites·20 claims
1083US10707081B2Fine line patterning methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 7, 2020·2 cites·18 claims
1183US2024297042A1Method of manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
1283US2024371653A1Landing metal etch process for improved overlay controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
1382US12125712B2Landing metal etch process for improved overlay controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 22, 2024·0 cites·20 claims
1482US8972909B1OPC method with higher degree of freedomTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Mar 3, 2015·4 cites·20 claims
1582US7778805B2Regression system and methods for optical proximity correction modelingTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Aug 17, 2010·7 cites·27 claims
1681US12494359B2Stacked wafer structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Dec 9, 2025·0 cites·20 claims
1781US10990744B2Method and apparatus for integrated circuit mask patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 27, 2021·1 cites·20 claims
1881US10727113B2Methods of forming metal layer structures in semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 28, 2020·2 cites·20 claims
1979US12266528B2Method for forming patterned mask layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 1, 2025·0 cites·20 claims
2079US11955338B2Directional deposition for semiconductor fabricationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
2179US9213233B2Photolithography scattering bar structure and methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Dec 15, 2015·3 cites·20 claims
2278US12062543B2Line-end extension method and deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 13, 2024·0 cites·20 claims
2378US10991583B2Self aligned litho etch process patterning methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Apr 27, 2021·1 cites·20 claims
2477US12243744B2Method for forming semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
2577US11798812B2Landing metal etch process for improved overlay controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 24, 2023·0 cites·20 claims
2677US2024087896A1Line-end extension method and deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
2776US10768298B2Vehicle sensing system with 360 degree near range sensingMAGNA ELECTRONICS INC·Filed 2017·Granted Sep 8, 2020·3 cites·20 claims
2876US9026956B1Method of lithographic process evaluationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·4 cites·20 claims
2975US11862465B2Fine line patterning methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
3075US11610778B2Self aligned litho etch process patterning methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 21, 2023·0 cites·20 claims
3175US2025357208A1Area selective deposition for zero via enclosure and extremely small metal line end spaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
3275US2025201562A1Method for forming patterned mask layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
3374US11569090B2Directional deposition for semiconductor fabricationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 31, 2023·0 cites·20 claims
3472US2025096004A1Semiconductor structures and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
3571US11748549B2Method and apparatus for integrated circuit mask patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 5, 2023·0 cites·20 claims
3670US11239078B2Fine line patterning methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 1, 2022·0 cites·18 claims
3770US9195134B2Method and apparatus for integrated circuit mask patterningTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 24, 2015·2 cites·17 claims
3868US11854807B2Line-end extension method and deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 26, 2023·0 cites·20 claims
3968US8972912B1Structure for chip extensionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Mar 3, 2015·2 cites·20 claims
4067US12191155B2Semiconductor structures and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 7, 2025·0 cites·20 claims
4167US12080544B2Stacked wafer structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 3, 2024·0 cites·20 claims
4267US6489085B2Thermal reflow photolithographic processUNITED MICROELECTRONICS CORP·Filed 2000·Granted Dec 3, 2002·10 cites·7 claims
4366US12494411B2Integrated circuit and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 9, 2025·0 cites·20 claims
4465US6596448B2Phase error monitor pattern and applicationUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jul 22, 2003·12 cites·14 claims
4562US6582858B2Alternating phase shifting maskUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jun 24, 2003·8 cites·14 claims
4661US11075079B2Directional deposition for semiconductor fabricationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 27, 2021·0 cites·20 claims
4761US2023282514A1Area selective deposition for zero via enclosure and extremely small metal line end spaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
4859US8048590B2Photolithography mask having a scattering bar structure that includes transverse linear assist featuresTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Nov 1, 2011·0 cites·20 claims
4956US10234548B2Ultrasonic detection device to determine interference source by an additional reception modeMAGNA ELECTRONICS SOLUTIONS GMBH·Filed 2015·Granted Mar 19, 2019·1 cites·13 claims
5051US11201064B2Signal line patterning for standard cellsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 14, 2021·0 cites·20 claims

Showing the top 50 of 69 patent records by PatentIndex Score.

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →