Inventor · disambiguated record
Changjun Lee
Also filed as: LEE CHANGJUN
9 granted patents·3 pending applications·2 citations·filing 2016–2025
76Inventor score
Top patents by PatentIndex Score
12 records- 0177US11989422B2Memory device, electronic device and operating method of memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 21, 2024·1 cites·20 claims
- 0271US11889973B2Vacuum cleanerLG ELECTRONICS INC·Filed 2022·Granted Feb 6, 2024·0 cites·16 claims
- 0369US11344170B2Vacuum cleanerLG ELECTRONICS INC·Filed 2017·Granted May 31, 2022·1 cites·19 claims
- 0460US11457791B2Cleaner and control method thereofLG ELECTRONICS INC·Filed 2020·Granted Oct 4, 2022·0 cites·15 claims
- 0558US2020187742A1Cleaner and control method thereofLG ELECTRONICS INC·Filed 2020·Application pending·0 cites
- 0657US2025355562A1Method and device with page migration of tiered memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0756US12468452B2Storage device including nonvolatile memory device and controllerSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·18 claims
- 0856US12135897B2Memory controller, a storage device, and an operating method of the storage device preliminary classSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 5, 2024·0 cites·20 claims
- 0954US12412633B2Flash memory for reducing reliability degradation of OS data due to SMT processSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·20 claims
- 1050US10709306B2Cleaner and control method thereofLG ELECTRONICS INC·Filed 2016·Granted Jul 14, 2020·0 cites·17 claims
- 1146US12360665B2Storage device for executing processing code and operating method of the storage deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 15, 2025·0 cites·18 claims
- 1243US2024152280A1Flash memory for reducing reliability degradation of os data due to smt process and method for operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →