Inventor · disambiguated record
Chung-Tse Lee
Also filed as: LEE CHUNG-TSE
10 granted patents·16 citations·filing 2012–2015
82Inventor score
Files withMPI CORP10
Top patents by PatentIndex Score
10 records- 0190US10119991B2Vertical probe device and supporter used in the sameMPI CORP·Filed 2015·Granted Nov 6, 2018·8 cites·3 claims
- 0275US9157929B2Apparatus for probing die electricity and method for forming the sameMPI CORP·Filed 2012·Granted Oct 13, 2015·3 cites·14 claims
- 0367US9435856B2Position adjustable probing device and probe card assembly using the sameMPI CORP·Filed 2014·Granted Sep 6, 2016·2 cites·16 claims
- 0465US9643271B2Method for making support structure for probing deviceMPI CORP·Filed 2015·Granted May 9, 2017·2 cites·15 claims
- 0561US9470750B2Alignment adjusting mechanism for probe card, position adjusting module using the same and modularized probing deviceMPI CORP·Filed 2014·Granted Oct 18, 2016·1 cites·18 claims
- 0654US9506978B2Apparatus for probing die electricity and method for forming the sameMPI CORP·Filed 2015·Granted Nov 29, 2016·0 cites·17 claims
- 0748US9638716B2Positioner of probe card and probe head of probe cardMPI CORP·Filed 2014·Granted May 2, 2017·0 cites·15 claims
- 0847US9341648B2Probe card and manufacturing method thereofMPI CORP·Filed 2013·Granted May 17, 2016·0 cites·9 claims
- 0946US9648757B2Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contactsMPI CORP·Filed 2014·Granted May 9, 2017·0 cites·6 claims
- 1037US9465050B2Assembling method and maintaining method for vertical probe deviceMPI CORP·Filed 2015·Granted Oct 11, 2016·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →