Inventor · disambiguated record
Chi-Hsien Li
Also filed as: LI CHI-HSIEN
0 granted patents·3 pending applications·0 citations·filing 2024–2024
Technology areasG01R
Files withMPI CORP3
Top patents by PatentIndex Score
3 records- 0180US2024393368A1Probe system for testing of devices under test integrated on a semiconductor wafer, and probe card, probe head, and guiding plate structure thereinMPI CORP·Filed 2024·Application pending·0 cites
- 0280US2024393367A1Probe system for testing of devices under test integrated on a semiconductor wafer, and probe card, probe head, and guiding plate structure thereinMPI CORP·Filed 2024·Application pending·0 cites
- 0361US2024402218A1Probe system for testing device under test integrated in semiconductor wafer, and probe card, probe head and guide plate structure thereofMPI CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →