Inventor · disambiguated record
Christopher Liman
Also filed as: LIMAN CHRISTOPHER · LIMAN CHRISTOPHER D
5 granted patents·4 pending applications·6 citations·filing 2011–2025
67Inventor score
Top patents by PatentIndex Score
9 records- 0188US12360062B1Methods and systems for regularizing the optimization of application specific semiconductor measurement system parameter settingsKLA CORP·Filed 2022·Granted Jul 15, 2025·2 cites·23 claims
- 0276US9260443B2Organic electronic devices prepared using decomposable polymer additivesHAWKER CRAIG J·Filed 2011·Granted Feb 16, 2016·4 cites·24 claims
- 0374US12480893B2Optical and X-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·39 claims
- 0468US2025237619A1Optical and x-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2025·Application pending·0 cites
- 0553US12019030B2Methods and systems for targeted monitoring of semiconductor measurement qualityKLA CORP·Filed 2022·Granted Jun 25, 2024·0 cites·19 claims
- 0652US2024060914A1Methods And Systems For X-Ray Scatterometry Measurements Employing A Machine Learning Based Electromagnetic Response ModelKLA CORP·Filed 2022·Application pending·0 cites
- 0751US2024085321A1Methods And Systems For Model-less, Scatterometry Based Measurements Of Semiconductor StructuresKLA CORP·Filed 2023·Application pending·0 cites
- 0848US11990380B2Methods and systems for combining x-ray metrology data sets to improve parameter estimationKLA CORP·Filed 2020·Granted May 21, 2024·0 cites·17 claims
- 0934US2016155974A1Complex pnictide metal halides for optoelectronic applicationsMITSUBISHI CHEM CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →