Inventor · disambiguated record
Chien-Hsun Lin
Also filed as: LIN CHIEN · LIN CHIEN F · LIN CHIEN-HSUN
9 granted patents·6 pending applications·39 citations·filing 2003–2025
84Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD7TAIWAN SEMICONDUCTOR MFG4PENG JUI-CHUNG2LANNER ELECTRONICS INC1LIN CHIEN-HSUN1
Top patents by PatentIndex Score
15 records- 0192US8199314B2System and method for improving immersion scanner overlay performancePENG JUI-CHUNG·Filed 2011·Granted Jun 12, 2012·12 cites·20 claims
- 0288US9159812B1Fin sidewall removal to enlarge epitaxial source/drain volumeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Oct 13, 2015·9 cites·20 claims
- 0379US8068208B2System and method for improving immersion scanner overlay performancePENG JUI-CHUNG·Filed 2007·Granted Nov 29, 2011·5 cites·17 claims
- 0478US2025364370A1Through vias and guard rings of semiconductor structure and method of forming thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0576US9490254B2Fin sidewall removal to enlarge epitaxial source/drain volumeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Nov 8, 2016·2 cites·20 claims
- 0675US2025364239A1Structure and Formation Method of Semiconductor Device with Backside Conductive ContactTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0770US6979820B2CD SEM automatic focus methodology and apparatus for constant electron beam dosage controlTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Dec 27, 2005·9 cites·30 claims
- 0869US2025046679A1Through vias and guard rings of semiconductor structure and method of forming thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0966US11287867B2Power sequence monitoring systemLANNER ELECTRONICS INC·Filed 2020·Granted Mar 29, 2022·1 cites·9 claims
- 1066US2025149324A1Structure and Formation Method of Semiconductor Device with Backside Conductive ContactTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1161US7571021B2Method and system for improving critical dimension uniformityTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Aug 4, 2009·1 cites·17 claims
- 1254US2023343583A1Methods of forming semiconductor device structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 1346US2006196417A1Gas distribution systems for deposition processesTAIWAN SEMICONDUCTOR MFG·Filed 2005·Application pending·0 cites
- 1440US7787977B2Methods and systems for forming semiconductor structuresTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Aug 31, 2010·0 cites·14 claims
- 1534US9529275B2Lithography scanner throughputLIN CHIEN-HSUN·Filed 2007·Granted Dec 27, 2016·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →