Inventor · disambiguated record
Chen-Bin Lin
Also filed as: LIN CHEN-BIN
35 granted patents·5 pending applications·356 citations·filing 1998–2025
97Inventor score
Top patents by PatentIndex Score
40 records- 0196US9564217B1Semiconductor memory device having integrated DOSRAM and NOSRAMUNITED MICROELECTRONICS CORP·Filed 2015·Granted Feb 7, 2017·18 cites·9 claims
- 0296US9431441B1Image sensor pixel structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 30, 2016·15 cites·20 claims
- 0392US6617189B1Method of fabricating an image sensorUNITED MICROELECTRONICS CORP·Filed 2002·Granted Sep 9, 2003·128 cites·15 claims
- 0489US12283595B2Integration of multiple transistors having fin and mesa structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Apr 22, 2025·1 cites·20 claims
- 0587US6507059B2Structure of a CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jan 14, 2003·39 cites·9 claims
- 0686US6607951B2Method for fabricating a CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2001·Granted Aug 19, 2003·44 cites·10 claims
- 0780US9627549B1Semiconductor transistor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 18, 2017·3 cites·9 claims
- 0880US9455351B1Oxide semiconductor field effect transistor device and method for manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·3 cites·20 claims
- 0977US6506619B2Structure of a CMOS image sensor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2002·Granted Jan 14, 2003·20 cites·11 claims
- 1076US9893066B2Semiconductor transistor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 13, 2018·2 cites·5 claims
- 1175US2025323149A1Semiconductor structure with resistor and capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1274US6541329B1Method for making an active pixel sensorUNITED MICROELECTRONICS CORP·Filed 2001·Granted Apr 1, 2003·21 cites·17 claims
- 1371US12506068B2Semiconductor structure with resistor and capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 23, 2025·0 cites·20 claims
- 1471US2025221033A1Integration of multiple transistors having fin and mesa structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1565US9620649B1Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 11, 2017·1 cites·12 claims
- 1664US9966428B2Capacitor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 8, 2018·1 cites·10 claims
- 1762US6303406B1Method for integrating anti-reflection layer and salicide blockUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 16, 2001·9 cites·27 claims
- 1861US6906364B2Structure of a CMOS image sensorUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jun 14, 2005·9 cites·8 claims
- 1956US11011649B2Oxide semiconductor device and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted May 18, 2021·0 cites·9 claims
- 2055US10056493B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 21, 2018·0 cites·9 claims
- 2155US6355530B1Method of manufacturing a mask ROM bit lineUNITED MICROELECTRONICS CORP·Filed 2000·Granted Mar 12, 2002·6 cites·16 claims
- 2254US9530834B1Capacitor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·0 cites·6 claims
- 2353US10115786B2Capacitor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 30, 2018·0 cites·9 claims
- 2453US10102907B2Method for fabricating semiconductor memory device having integrated DOSRAM and NOSRAMUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 16, 2018·0 cites·10 claims
- 2553US9887293B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 6, 2018·0 cites·10 claims
- 2649US10043917B2Oxide semiconductor device and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 7, 2018·0 cites·8 claims
- 2747US9851780B2Semiconductor device and operating method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 26, 2017·0 cites·7 claims
- 2845US6479317B2Method for integrating anti-reflection layer and salicide blockUNITED MICROELECTRONICS CORP·Filed 2001·Granted Nov 12, 2002·2 cites·34 claims
- 2944US9349873B1Oxide semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 24, 2016·0 cites·20 claims
- 3042US9935099B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Apr 3, 2018·0 cites·21 claims
- 3141US6225209B1Method of fabricating crack resistant inter-layer dielectric for a salicide processUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 1, 2001·10 cites·6 claims
- 3240US9749567B2Operating method of image sensorUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 29, 2017·0 cites·12 claims
- 3340US6086951AMethod for forming metallic capacitorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 11, 2000·9 cites·20 claims
- 3437US6114196AMethod of fabricating metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Sep 5, 2000·5 cites·8 claims
- 3535US2017098599A1Oxide semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 3635US2017084614A1Memory cell with oxide semiconductor field effect transistor device integrated thereinUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 3735US2003085415A1CMOS image sensor deviceFiled 2001·Application pending·0 cites
- 3834US6376359B1Method of manufacturing metallic interconnectUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 23, 2002·6 cites·13 claims
- 3931US6242315B1Method of manufacturing mixed mode semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 5, 2001·3 cites·13 claims
- 4031US6033965AProcess for fabricating mixed signal integrated circuitUNITED MICROELECTRONICS CORP·Filed 1999·Granted Mar 7, 2000·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →