Inventor · disambiguated record
Cheng Chi Liu
Also filed as: LIU CHENG-CHI
3 granted patents·7 citations·filing 2006–2011
60Inventor score
Technology areasG11C
Top patents by PatentIndex Score
3 records- 0162US8605525B2System and method for testing for defects in a semiconductor memory arrayHUANG YIN CHIN·Filed 2010·Granted Dec 10, 2013·4 cites·5 claims
- 0251US7580302B2Parallel threshold voltage margin search for MLC memory applicationMACRONIX INT CO LTD·Filed 2006·Granted Aug 25, 2009·2 cites·19 claims
- 0343US8498168B2Test method for screening local bit-line defects in a memory arrayHUANG YIN CHIN·Filed 2011·Granted Jul 30, 2013·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →