Inventor · disambiguated record
Chuan Liu
Also filed as: LIU CHUAN · LIU CHUAN H · LIU CHUAN-HSI
11 granted patents·1 pending application·133 citations·filing 1998–2021
89Inventor score
Files withUNITED MICROELECTRONICS CORP6UNIV SOUTHWEST PETROLEUM3LIN KUEI-CHIH1UNITED MICROELETRONICS CORP1ZHEJIANG HISUN PHARM CO LTD1
Top patents by PatentIndex Score
12 records- 0188US10782220B1Cross-scale wide-spectrum particle size plugging formula granularity analysis methodUNIV SOUTHWEST PETROLEUM·Filed 2020·Granted Sep 22, 2020·4 cites·2 claims
- 0278US6555485B1Method for fabricating a gate dielectric layerUNITED MICROELECTRONICS CORP·Filed 2002·Granted Apr 29, 2003·33 cites·9 claims
- 0377US6653856B1Method of determining reliability of semiconductor productsUNITED MICROELECTRONICS CORP·Filed 2002·Granted Nov 25, 2003·22 cites·11 claims
- 0475US6268269B1Method for fabricating an oxide layer on silicon with carbon ions introduced at the silicon/oxide interface in order to reduce hot carrier effectsUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 31, 2001·39 cites·22 claims
- 0560US6072677AElectrostatic discharge protective circuit formed by use of a silicon controlled rectifierUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 6, 2000·22 cites·18 claims
- 0646US11017134B1Quantitative scoring and optimization method of drilling and completion loss-control materialUNIV SOUTHWEST PETROLEUM·Filed 2020·Granted May 25, 2021·0 cites·8 claims
- 0742US6570388B2Transmission line pulse method for measuring electrostatic discharge voltagesUNITED MICROELETRONICS CORP·Filed 2001·Granted May 27, 2003·3 cites·1 claims
- 0837US11391145B2Dynamic fracture width calculation method for drilling fluid loss in fractured formationUNIV SOUTHWEST PETROLEUM·Filed 2021·Granted Jul 19, 2022·0 cites·4 claims
- 0935US9718802B2Crystal form of dabigatran etexilate mesylate and preparation method and use thereofZHEJIANG HISUN PHARM CO LTD·Filed 2015·Granted Aug 1, 2017·0 cites·15 claims
- 1033US6269315B1Reliability testing method of dielectric thin filmUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 31, 2001·5 cites·12 claims
- 1133US6249139B1Lifetime measurement of an ultra-thin dielectric layerUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 19, 2001·5 cites·5 claims
- 1220US2013187458A1Power saving outlet system and method for controlling thereofLIN KUEI-CHIH·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →