Inventor · disambiguated record
Ching-Ling Pai
Also filed as: PAI CHING-LING
0 granted patents·5 pending applications·0 citations·filing 2023–2025
Files withMPI CORP5
Top patents by PatentIndex Score
5 records- 0175US2025044350A1Method of determining probing parameters for probe system to test device under test, probe system and method of operating the same, non-transitory computer-readable storage media, method of testing unpackaged semiconductor device, tested semiconductor device and method of producing the same, and method of generating virtual mark imageMPI CORP·Filed 2024·Application pending·0 cites
- 0274US2025044346A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0374US2025044349A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0463US2025327862A1Method, system, device, and media related to drift verificationMPI CORP·Filed 2025·Application pending·0 cites
- 0552US2024402238A1Test system and method for data verification for the sameMPI CORP·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →