Inventor · disambiguated record
Christopher Pawlowicz
Also filed as: PAWLOWICZ CHRISTOPHER
10 granted patents·4 pending applications·10 citations·filing 2012–2023
82Inventor score
Top patents by PatentIndex Score
14 records- 0189US11214874B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2020·Granted Jan 4, 2022·2 cites·9 claims
- 0282US9915628B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2016·Granted Mar 13, 2018·3 cites·19 claims
- 0381US9534299B2Method and system for ion beam delayering of a sample and control thereofSEMICONDUCTOR INSIGHTS INC·Filed 2012·Granted Jan 3, 2017·4 cites·9 claims
- 0467US10469777B2Methods, systems and devices relating to distortion correction in imaging devicesTECHINSIGHTS INC·Filed 2016·Granted Nov 5, 2019·1 cites·19 claims
- 0555US10689763B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Jun 23, 2020·0 cites·11 claims
- 0655US10550480B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Feb 4, 2020·0 cites·12 claims
- 0751US2025014323A1Machine learning system and method for object-specific recognitionTECHINSIGHTS INC·Filed 2022·Application pending·0 cites
- 0850US12176177B2Ion beam chamber fluid delivery apparatus and method and ion beam etcher using sameTECHINSIGHTS INC·Filed 2022·Granted Dec 24, 2024·0 cites·18 claims
- 0949US2025104257A1Image registration methods and systemsTECHINSIGHTS INC·Filed 2023·Application pending·0 cites
- 1048US2025148185A1System and method for automatic extraction of integrated circuit component dataTECHINSIGHTS INC·Filed 2023·Application pending·0 cites
- 1146US12498417B2Contrast-enhancing staining system and method and imaging methods and systems related theretoTECHINSIGHTS INC·Filed 2021·Granted Dec 16, 2025·0 cites·26 claims
- 1241US12165840B2Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related theretoTECHINSIGHTS INC·Filed 2019·Granted Dec 10, 2024·0 cites·17 claims
- 1341US2022122805A1Ion beam delayering system and method, and endpoint monitoring system and method thereforTECHINSIGHTS INC·Filed 2020·Application pending·0 cites
- 1438US9529040B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2015·Granted Dec 27, 2016·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →