Inventor · disambiguated record
Charles G. Potter
Also filed as: POTTER CHARLES · POTTER CHARLES G · POTTER SR CHARLES GREGORY
11 granted patents·1 pending application·21 citations·filing 2014–2025
85Inventor score
Files withAPPLIED MATERIALS INC12
Top patents by PatentIndex Score
12 records- 0193US10794681B2Long range capacitive gap measurement in a wafer form sensor systemAPPLIED MATERIALS INC·Filed 2018·Granted Oct 6, 2020·8 cites·19 claims
- 0290US12215966B2Methods and systems of optical inspection of electronic device manufacturing machinesAPPLIED MATERIALS INC·Filed 2020·Granted Feb 4, 2025·2 cites·14 claims
- 0390US10847393B2Method and apparatus for measuring process kit centeringAPPLIED MATERIALS INC·Filed 2018·Granted Nov 24, 2020·6 cites·18 claims
- 0487US11387122B2Method and apparatus for measuring process kit centeringAPPLIED MATERIALS INC·Filed 2020·Granted Jul 12, 2022·2 cites·11 claims
- 0569US11978647B2Method and apparatus for measuring erosion and calibrating position for a moving process kitAPPLIED MATERIALS INC·Filed 2022·Granted May 7, 2024·0 cites·11 claims
- 0667US11404296B2Method and apparatus for measuring placement of a substrate on a heater pedestalAPPLIED MATERIALS INC·Filed 2019·Granted Aug 2, 2022·1 cites·13 claims
- 0765US2025155234A1Methods and systems of optical inspection of electronic device manufacturing machinesAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0864US11342210B2Method and apparatus for measuring wafer movement and placement using vibration dataAPPLIED MATERIALS INC·Filed 2019·Granted May 24, 2022·1 cites·20 claims
- 0963US11908724B2Method and apparatus for measuring placement of a substrate on a heater pedestalAPPLIED MATERIALS INC·Filed 2022·Granted Feb 20, 2024·0 cites·7 claims
- 1063US10522380B2Method and apparatus for determining substrate placement in a process chamberAPPLIED MATERIALS INC·Filed 2014·Granted Dec 31, 2019·1 cites·18 claims
- 1155US11521872B2Method and apparatus for measuring erosion and calibrating position for a moving process kitAPPLIED MATERIALS INC·Filed 2019·Granted Dec 6, 2022·0 cites·16 claims
- 1250US11054317B2Method and apparatus for direct measurement of chucking force on an electrostatic chuckAPPLIED MATERIALS INC·Filed 2019·Granted Jul 6, 2021·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →