Inventor · disambiguated record
Christopher Sears
Also filed as: SEARS CHRISTOPHER · SEARS CHRISTOPHER A · SEARS CHRISTOPHER M · SEARS CHRISTOPHER M S
12 granted patents·1 pending application·38 citations·filing 2004–2018
85Inventor score
Top patents by PatentIndex Score
13 records- 0194US9165742B1Inspection site preparationKLA TENCOR CORP·Filed 2015·Granted Oct 20, 2015·21 cites·33 claims
- 0291US10338013B1Position feedback for multi-beam particle detectorKLA TENCOR CORP·Filed 2018·Granted Jul 2, 2019·10 cites·31 claims
- 0383US9082580B2Notched magnetic lens for improved sample access in an SEMKLA TENCOR CORP·Filed 2014·Granted Jul 14, 2015·4 cites·23 claims
- 0469US11087950B2Charge control device for a system with multiple electron beamsKLA TENCOR CORP·Filed 2018·Granted Aug 10, 2021·1 cites·20 claims
- 0563US8752437B2Magnet strength measurementSEARS CHRISTOPHER M S·Filed 2012·Granted Jun 17, 2014·2 cites·19 claims
- 0653US9171694B2Asymmetric electrostatic quadrupole deflector for improved field uniformityKLA TENCOR CORP·Filed 2014·Granted Oct 27, 2015·0 cites·22 claims
- 0744US2005204480A1Washing machine with tilt-out laundry assemblyMAYTAG CORP·Filed 2004·Application pending·0 cites
- 0843US9232626B2Wafer grounding using localized plasma sourceKLA TENCOR CORP·Filed 2014·Granted Jan 5, 2016·0 cites·35 claims
- 0940US10790114B2Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltagesKLA TENCOR CORP·Filed 2017·Granted Sep 29, 2020·0 cites·20 claims
- 1039US9892885B2System and method for drift compensation on an electron beam based characterization toolKLA TENCOR CORP·Filed 2016·Granted Feb 13, 2018·0 cites·22 claims
- 1137US11302511B2Field curvature correction for multi-beam inspection systemsKLA TENCOR CORP·Filed 2016·Granted Apr 12, 2022·0 cites·8 claims
- 1236US10460903B2Method and system for charge control for imaging floating metal structures on non-conducting substratesKLA TENCOR CORP·Filed 2016·Granted Oct 29, 2019·0 cites·57 claims
- 1336US9653257B2Method and system for reducing charging artifacts in scanning electron microscopy imagesKLA TENCOR CORP·Filed 2016·Granted May 16, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →