Inventor · disambiguated record
Choong-Sun Shin
Also filed as: SHIN CHOONG SUN
34 granted patents·1 pending application·361 citations·filing 1994–2016
97Inventor score
Top patents by PatentIndex Score
35 records- 0196US6262938B1Synchronous DRAM having posted CAS latency and method for controlling CAS latencySAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jul 17, 2001·135 cites·24 claims
- 0294US9779665B2Gate driver for display device and display device including the sameSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Oct 3, 2017·10 cites·20 claims
- 0391US10229636B2Pixel of an organic light emitting diode display device, and organic light emitting diode display deviceSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Mar 12, 2019·6 cites·24 claims
- 0489US9779666B2Organic light emitting display and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Oct 3, 2017·6 cites·20 claims
- 0589US9355596B2Organic light emitting display deviceSAMSUNG DISPLAY CO LTD·Filed 2013·Granted May 31, 2016·9 cites·13 claims
- 0687US9818341B2Organic light-emitting display device and method of driving the sameSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Nov 14, 2017·5 cites·15 claims
- 0787US9734765B2Display device and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Aug 15, 2017·6 cites·13 claims
- 0885US8817549B2Integrated circuit memory deviceSHIN CHOONG-SUN·Filed 2012·Granted Aug 26, 2014·13 cites·16 claims
- 0983US9875693B2Data driver and organic light emitting display device having the sameSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Jan 23, 2018·3 cites·20 claims
- 1082US9875685B2Display device and method for compensation of image data of the sameSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Jan 23, 2018·4 cites·10 claims
- 1180US9805648B2AMOLED display device including compensaton unit and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Oct 31, 2017·3 cites·15 claims
- 1280US5657280ADefective cell repairing circuit and method of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Aug 12, 1997·48 cites·18 claims
- 1379US7982245B2Circuit with fuse/anti-fuse transistor with selectively damaged gate insulating layerSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 19, 2011·8 cites·10 claims
- 1476US9450567B2Noise removing circuit and current sensing unit including the sameSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Sep 20, 2016·2 cites·7 claims
- 1575US10325566B2Touch device detecting mutual capacitance and self capacitance and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Jun 18, 2019·2 cites·15 claims
- 1675US10044366B2Non-linear gamma compensation current mode digital-analog convertor and display device including the sameSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Aug 7, 2018·2 cites·20 claims
- 1775US9576536B2Display device and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Feb 21, 2017·2 cites·15 claims
- 1872US9318076B2Pixel luminance compensating unit, flat panel display device having the same and method of adjusting a luminance curve for respective pixelsSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Apr 19, 2016·2 cites·19 claims
- 1972US7295488B2Apparatus and methods for generating a column select line signal in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 13, 2007·8 cites·24 claims
- 2071US6839291B2Method for controlling column decoder enable timing in synchronous semiconductor device and apparatus thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 4, 2005·17 cites·30 claims
- 2167US9485081B2Apparatus for compensating for skew between data signals and clock signalSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Nov 1, 2016·2 cites·12 claims
- 2265US9153175B2Display device and method for compensation of image data of the sameSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Oct 6, 2015·1 cites·17 claims
- 2362US5483493AMulti-bit test circuit of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Jan 9, 1996·20 cites·2 claims
- 2460US6909650B2Circuit and method for transforming data input/output format in parallel bit testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 21, 2005·11 cites·7 claims
- 2559US8547766B2Area-efficient data line layouts to suppress the degradation of electrical characteristicsWON JONG-HAK·Filed 2010·Granted Oct 1, 2013·2 cites·16 claims
- 2652US7332955B2High voltage generating circuit and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Feb 19, 2008·3 cites·10 claims
- 2751US9297703B2Temperature sensing device and method of driving thereofSAMSUNG DISPLAY CO LTD·Filed 2012·Granted Mar 29, 2016·0 cites·25 claims
- 2851US5610865ASemiconductor memory device with redundancy structureSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Mar 11, 1997·16 cites·9 claims
- 2948US2015116384A1Display device and compensation method for the sameSAMSUNG DISPLAY CO LTD·Filed 2014·Application pending·0 cites
- 3046US10186207B2Display device for enhancing a driving speed, and driving method thereofSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Jan 22, 2019·0 cites·20 claims
- 3146US10042496B2Driving circuit and electronic device including the sameSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Aug 7, 2018·0 cites·18 claims
- 3246US9443470B2Organic light emitting display device and method of driving organic light emitting display deviceSAMSUNG DISPLAY CO LTD·Filed 2015·Granted Sep 13, 2016·0 cites·20 claims
- 3343US9886132B2Touch panel and correction method thereofSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Feb 6, 2018·0 cites·13 claims
- 3443US5959924AMethod and circuit for controlling an isolation gate in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Sep 28, 1999·9 cites·12 claims
- 3537US5991903AParallel bit test circuit for testing a semiconductor device in parallel bitsSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 23, 1999·6 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →