Inventor · disambiguated record
Chia-Chen Sun
Also filed as: SUN CHIA-CHEN
20 granted patents·8 pending applications·12 citations·filing 2009–2025
89Inventor score
Top patents by PatentIndex Score
28 records- 0183US10566290B2Alignment mark and measurement method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 18, 2020·4 cites·14 claims
- 0282US10156526B1Method for reviewing defectsUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 18, 2018·2 cites·8 claims
- 0380US10082471B2Semiconductor structure and method for reviewing defectsUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 25, 2018·2 cites·10 claims
- 0472US12416855B2Photomask structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Sep 16, 2025·0 cites·16 claims
- 0571US12439579B2Static random access memory and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Oct 7, 2025·0 cites·17 claims
- 0671US2025266372A1Die seal ring structureUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0769US12261083B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Mar 25, 2025·0 cites·18 claims
- 0866US12474635B2Photomask structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Nov 18, 2025·0 cites·18 claims
- 0966US8890551B2Test key structure and method for measuring step height by such test key structureKANG CHIH-KAI·Filed 2011·Granted Nov 18, 2014·2 cites·20 claims
- 1065US12429762B2Method of forming a layout pattern and photomaskUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 30, 2025·0 cites·16 claims
- 1165US12322711B2Die seal ring structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jun 3, 2025·0 cites·6 claims
- 1265US2025191974A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 1361US12321287B1Interconnects for physically unclonable function and method of achieving physically unclonable function through interconnectsUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jun 3, 2025·0 cites·12 claims
- 1461US10510677B2DieUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 17, 2019·0 cites·6 claims
- 1561US2024202417A1Design method of shuttle maskUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1658US8624398B2Semiconductor circuit structureSUN CHIA-CHEN·Filed 2009·Granted Jan 7, 2014·2 cites·12 claims
- 1757US12394730B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Aug 19, 2025·0 cites·15 claims
- 1857US2024345469A1Photomask structureUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1957US2025237942A1Photomask design method, semiconductor manufacturing process, and semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2055US2025014991A1Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2155US2025348625A1Circuit patterns for physically unclonable function and method of achieving physically unclonable function through circuit patternsUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2253US10983428B2Mask and method of forming patternUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 20, 2021·0 cites·16 claims
- 2353US8850370B2Method of manufacturing semiconductor circuit structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 30, 2014·0 cites·18 claims
- 2453US2025072080A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2551US7932104B2Method for inspecting photoresist patternUNITED MICROELECTRONICS CORP·Filed 2009·Granted Apr 26, 2011·0 cites·15 claims
- 2643US11372324B2Method for correcting mask pattern and mask pattern thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jun 28, 2022·0 cites·6 claims
- 2741US10176289B2Method for decomposing semiconductor layout patternUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 8, 2019·0 cites·19 claims
- 2839US9147678B2Resistor and fabrication method thereofKANG CHIH-KAI·Filed 2012·Granted Sep 29, 2015·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →