Inventor · disambiguated record
Chin-Yi Tsai
Also filed as: TSAI CHIN-YI
11 granted patents·2 pending applications·36 citations·filing 2003–2022
83Inventor score
Top patents by PatentIndex Score
13 records- 0187US12025637B2Probe cardMPI CORP·Filed 2021·Granted Jul 2, 2024·2 cites·18 claims
- 0271US9201098B2High frequency probe cardMPI CORP·Filed 2013·Granted Dec 1, 2015·3 cites·20 claims
- 0366US11465530B2Battery regenerative strength control method for electronic vehicleACER INC·Filed 2020·Granted Oct 11, 2022·0 cites·8 claims
- 0458US7083581B2Multi-functional massagerTSAI CHIN-YI·Filed 2004·Granted Aug 1, 2006·30 cites·6 claims
- 0556US10908221B2Battery power estimating method and electronic deviceACER INC·Filed 2019·Granted Feb 2, 2021·0 cites·12 claims
- 0650US11424628B2Balance charging method and charging device for charging multiple battery cellsACER INC·Filed 2020·Granted Aug 23, 2022·0 cites·6 claims
- 0749US11774468B2Vertical probe headMPI CORP·Filed 2022·Granted Oct 3, 2023·0 cites·21 claims
- 0848US11029361B2Method for determining state of charge and electronic device thereofACER INC·Filed 2019·Granted Jun 8, 2021·0 cites·8 claims
- 0943US10168359B2Probe card for high voltage testingMPI CORP·Filed 2017·Granted Jan 1, 2019·0 cites·15 claims
- 1043US9244018B2Probe holding structure and optical inspection device equipped with the sameMPI CORP·Filed 2013·Granted Jan 26, 2016·0 cites·24 claims
- 1139US7040524B2Automated packaging apparatus and method of optical elementsIND TECH RES INST·Filed 2003·Granted May 9, 2006·1 cites·11 claims
- 1238US2014016124A1Optical inspection deviceMPI CORP·Filed 2013·Application pending·0 cites
- 1331US2018095111A1Coaxial probe card deviceMPI CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →