Inventor · disambiguated record
Christian Wojek
Also filed as: WOJEK CHRISTIAN
13 granted patents·5 pending applications·24 citations·filing 2009–2025
86Inventor score
Files withZEISS CARL SMT GMBH7ZEISS CARL AG4ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH2LUEKE STEFAN1LÜKE STEFAN1
Top patents by PatentIndex Score
18 records- 0187US12175650B2Processing image data setsZEISS CARL SMT GMBH·Filed 2021·Granted Dec 24, 2024·2 cites·24 claims
- 0285US9933606B2Surgical microscopeZEISS CARL MEDITEC AG·Filed 2015·Granted Apr 3, 2018·7 cites·12 claims
- 0381US9117102B2Automated imaging of predetermined regions in series of slicesZEISS CARL AG·Filed 2013·Granted Aug 25, 2015·6 cites·28 claims
- 0480US12008708B2Method and data processing system for creating or adapting individual images based on properties of a light ray within a lensZEISS CARL AG·Filed 2021·Granted Jun 11, 2024·1 cites·14 claims
- 0572US2024029342A1Method and data processing system for synthesizing imagesZEISS CARL AG·Filed 2023·Application pending·0 cites
- 0669US8934666B2Method and device for analyzing surrounding objects and/or surrounding scenes, such as for object and scene class segmentingLÜKE STEFAN·Filed 2009·Granted Jan 13, 2015·6 cites·24 claims
- 0762US10896351B2Active machine learning for training an event classificationZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH·Filed 2018·Granted Jan 19, 2021·2 cites·19 claims
- 0856US11436506B2Method and devices for determining metrology sitesZEISS CARL SMT GMBH·Filed 2020·Granted Sep 6, 2022·0 cites·27 claims
- 0955US12135540B2Devices and methods for examining and/or processing an element for photolithographyZEISS CARL SMT GMBH·Filed 2020·Granted Nov 5, 2024·0 cites·24 claims
- 1054US2025383304A1X-ray measurement arrangement for examining test objects with x-ray radiation and method for examining test objects with x-ray radiationZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH·Filed 2025·Application pending·0 cites
- 1153US10571721B2Computer-implemented method for determining a representation of a rim of a spectacles frame or a representation of the edges of the spectacle lensesZEISS CARL VISION INT GMBH·Filed 2019·Granted Feb 25, 2020·0 cites·23 claims
- 1252US11728130B2Method of recording an image using a particle microscopeZEISS CARL SMT GMBH·Filed 2021·Granted Aug 15, 2023·0 cites·26 claims
- 1351US12307334B2Method and device for evaluating a statistically distributed measured value in the examination of an element of a photolithography processZEISS CARL SMT GMBH·Filed 2021·Granted May 20, 2025·0 cites·25 claims
- 1449US11226481B2Methods and apparatuses for designing optical systems using machine learning with delano diagramsZEISS CARL AG·Filed 2018·Granted Jan 18, 2022·0 cites·17 claims
- 1546US12045969B2Automated root cause analysis for defect detection during fabrication processes of semiconductor structuresZEISS CARL SMT GMBH·Filed 2020·Granted Jul 23, 2024·0 cites·20 claims
- 1645US2020258212A1Error reduction in images which were generated with charged particles and with the aid of machine-learning-based methodsZEISS CARL SMT GMBH·Filed 2020·Application pending·0 cites
- 1740US2014028667A1Three-Dimensional Representation of ObjectsSPRUCK BERND·Filed 2013·Application pending·0 cites
- 1834US2011313665A1Method for Automatically Detecting a Driving Maneuver of a Motor Vehicle and a Driver Assistance System Comprising Said MethodLUEKE STEFAN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →