Inventor · disambiguated record
Cheol-Jong Woo
Also filed as: WOO CHEOL-JONG
3 granted patents·2 pending applications·9 citations·filing 2009–2014
62Inventor score
Top patents by PatentIndex Score
5 records- 0167US7973550B2Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Jul 5, 2011·3 cites·13 claims
- 0259US8674718B2Built off testing apparatusOH SE-JANG·Filed 2010·Granted Mar 18, 2014·2 cites·9 claims
- 0356US8606102B2Test interface device, test system and optical interface memory deviceLEE SANG-HOON·Filed 2009·Granted Dec 10, 2013·4 cites·12 claims
- 0447US2014139258A1Built off testing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0534US2012229159A1Test interface board and test system including the sameKIM JOON-YEON·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →