Inventor · disambiguated record
Chi-Chin Yeh
Also filed as: YEH CHI-CHIN
2 granted patents·35 citations·filing 1999–1999
62Inventor score
Files withUNITED MICROELECTRONICS CORP2
Top patents by PatentIndex Score
2 records- 0149US6156655ARetardation layer for preventing diffusion of metal layer and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 1999·Granted Dec 5, 2000·21 cites·8 claims
- 0248US6066532AMethod of fabricating embedded gate electrodesUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 23, 2000·14 cites·53 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →