Inventor · disambiguated record
Chun-Chi Yu
Also filed as: YU CHUN-CHI
46 granted patents·9 pending applications·94 citations·filing 2005–2025
97Inventor score
Files withREALTEK SEMICONDUCTOR CORP31UNITED MICROELECTRONICS CORP19CHEN YI-TING1CHUANG KAI-LIN1HOU YA-CHING1
Top patents by PatentIndex Score
55 records- 0197US10998061B1Memory system and memory access interface device thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted May 4, 2021·9 cites·16 claims
- 0292US10522204B1Memory signal phase difference calibration circuit and methodREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Dec 31, 2019·14 cites·20 claims
- 0389US9653404B1Overlay target for optically measuring overlay alignment of layers formed on semiconductor waferUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 16, 2017·10 cites·20 claims
- 0487US10978118B1DDR SDRAM signal calibration device and methodREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Apr 13, 2021·7 cites·20 claims
- 0586US10741231B1Memory access interface device including phase and duty cycle adjusting circuits for memory access signalsREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Aug 11, 2020·4 cites·11 claims
- 0685US9355708B2Memory control circuit for adjusting reference voltage and associated memory control methodREALTEK SEMICONDUCTOR CORP·Filed 2015·Granted May 31, 2016·5 cites·14 claims
- 0784US9007571B2Measurement method of overlay markUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 14, 2015·5 cites·19 claims
- 0883US9482964B2Overlap mark set and method for selecting recipe of measuring overlap errorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 1, 2016·4 cites·10 claims
- 0982US10269443B2Memory device and test method of the sameREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Apr 23, 2019·6 cites·16 claims
- 1082US9570130B2Memory system and memory physical layer interface circuitREALTEK SEMICONDUCTOR CORP·Filed 2016·Granted Feb 14, 2017·6 cites·20 claims
- 1179US10630289B1On-die-termination circuit and control method for of the sameREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Apr 21, 2020·3 cites·16 claims
- 1279US8564143B2Overlay mark for multiple pre-layers and currently layerCHEN YI-TING·Filed 2012·Granted Oct 22, 2013·3 cites·11 claims
- 1378US10698846B2DDR SDRAM physical layer interface circuit and DDR SDRAM control deviceREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Jun 30, 2020·4 cites·17 claims
- 1477US10916278B1Memory controller and memory data receiving method for generate better sampling clock signalREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Feb 9, 2021·4 cites·17 claims
- 1575US10998020B1Memory system and memory access interface device thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted May 4, 2021·1 cites·18 claims
- 1675US9400435B2Method of correcting overlay errorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jul 26, 2016·2 cites·21 claims
- 1771US10811362B2Overlay mark structure and measurement method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 20, 2020·1 cites·10 claims
- 1868US10643685B1Control circuit, sampling circuit for synchronous dynamic random-access memory, method of reading procedure and calibration thereofREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted May 5, 2020·2 cites·18 claims
- 1965US2025300648A1Data receiving apparatus and method having data valid window expanding mechanismREALTEK SEMICONDUCTOR CORP·Filed 2025·Application pending·0 cites
- 2064US11315656B1Detection circuit and detection methodREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Apr 26, 2022·0 cites·16 claims
- 2163US12147163B2Method for correcting critical dimension measurements of lithographic toolUNITED MICROELECTRONICS CORP·Filed 2021·Granted Nov 19, 2024·0 cites·9 claims
- 2261US11270745B2Method of foreground auto-calibrating data reception window and related deviceREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Mar 8, 2022·1 cites·12 claims
- 2360US9135980B2Memory control circuit and method of controlling data reading process of memory moduleREALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Sep 15, 2015·2 cites·20 claims
- 2459US11043460B2Measurement method of overlay mark structureUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jun 22, 2021·0 cites·11 claims
- 2559US2024402915A1Memory controller and memory data receiving methodREALTEK SEMICONDUCTOR CORP·Filed 2024·Application pending·0 cites
- 2658US12088359B2Receiver of communication system and eye diagram measuring methodREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Sep 10, 2024·0 cites·19 claims
- 2758US9147601B2Method of forming via holeUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 29, 2015·0 cites·11 claims
- 2858US8729716B2Alignment accuracy markCHUANG KAI-LIN·Filed 2011·Granted May 20, 2014·1 cites·6 claims
- 2957US12417795B2Physical layer circuit, write leveling training circuit and method for calibrating access control signal transmitted to memory deviceREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Sep 16, 2025·0 cites·20 claims
- 3057US11816352B2Electronic device, data strobe gate signal generator circuit and data strobe gate signal generating methodREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Nov 14, 2023·0 cites·20 claims
- 3156US12211699B2Method of removing step height on gate structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 28, 2025·0 cites·6 claims
- 3256US12106962B2Patterning method and overlay measurement methodUNITED MICROELECTRONICS CORP·Filed 2021·Granted Oct 1, 2024·0 cites·9 claims
- 3355US12300330B2Memory system and memory access interface device thereof for supporting different speed modesREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 3455US2025096784A1Signal transporting system and signal transporting methodREALTEK SEMICONDUCTOR CORP·Filed 2024·Application pending·0 cites
- 3554US12188982B2Test method for delay circuit and test circuitryREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Jan 7, 2025·0 cites·14 claims
- 3652US2025054534A1Memory signal calibration apparatus and methodREALTEK SEMICONDUCTOR CORP·Filed 2024·Application pending·0 cites
- 3751US12429902B2Memory system, memory access interface device and operation method thereofREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Sep 30, 2025·0 cites·18 claims
- 3850US9494873B2Asymmetry compensation method used in lithography overlay processUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 15, 2016·0 cites·13 claims
- 3949US11823770B1Memory system and memory access interface device thereofREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 4049US9136140B2Patterning methodUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 15, 2015·0 cites·16 claims
- 4148US12288583B2Memory controller and method for calibrating data reception windowREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Apr 29, 2025·0 cites·18 claims
- 4248US12009056B2Data transmission apparatus and method having clock gating mechanismREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Jun 11, 2024·0 cites·16 claims
- 4348US9448471B2Photo-mask and method of manufacturing semiconductor structures by using the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 20, 2016·0 cites·20 claims
- 4447US11978497B2DDR SDRAM signal calibration device and methodREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted May 7, 2024·0 cites·20 claims
- 4547US10916636B2Method of forming gateUNITED MICROELECTRONICS CORP·Filed 2019·Granted Feb 9, 2021·0 cites·12 claims
- 4647US8916051B2Method of forming via holeWU CHENG-HAN·Filed 2010·Granted Dec 23, 2014·0 cites·20 claims
- 4747US2024310869A1Memory system, memory access interface device and operation method thereofREALTEK SEMICONDUCTOR CORP·Filed 2023·Application pending·0 cites
- 4845US2016103396A1Double patterning methodUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 4944US2015276382A1Measurement mark structureUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 5042US7476472B2Method for designing photomaskUNITED MICROELECTRONICS CORP·Filed 2005·Granted Jan 13, 2009·0 cites·8 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →