Inventor · disambiguated record
Chi Yuan
Also filed as: YUAN CHI · YUAN CHI ALBERT
15 granted patents·1 pending application·15 citations·filing 2018–2023
87Inventor score
Files withADVANTEST CORP16
Top patents by PatentIndex Score
16 records- 0194US11430536B2Software-focused solution for arbitrary all-data odd sector size supportADVANTEST CORP·Filed 2021·Granted Aug 30, 2022·5 cites·19 claims
- 0291US12216559B2Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under testADVANTEST CORP·Filed 2023·Granted Feb 4, 2025·2 cites·19 claims
- 0390US10976361B2Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modesADVANTEST CORP·Filed 2018·Granted Apr 13, 2021·8 cites·23 claims
- 0477US12436855B2Systems and methods utilizing DAX memory management for testing CXL protocol enabled devicesADVANTEST CORP·Filed 2023·Granted Oct 7, 2025·0 cites·18 claims
- 0577US12203978B2Flexible sideband support systems and methodsADVANTEST CORP·Filed 2023·Granted Jan 21, 2025·0 cites·19 claims
- 0677US12197303B2Systems and methods for testing cxl enabled devices in parallelADVANTEST CORP·Filed 2023·Granted Jan 14, 2025·0 cites·17 claims
- 0776US12360868B2CXL protocol enablement for test environment systems and methodsADVANTEST CORP·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0872US12353306B2Management of hot add in a testing environment for DUTs that are CXL protocol enabledADVANTEST CORP·Filed 2023·Granted Jul 8, 2025·0 cites·18 claims
- 0969US11733290B2Flexible sideband support systems and methodsADVANTEST CORP·Filed 2021·Granted Aug 22, 2023·0 cites·20 claims
- 1064US12248390B2Lockless log and error reporting for automatic test equipmentADVANTEST CORP·Filed 2023·Granted Mar 11, 2025·0 cites·20 claims
- 1161US12332829B2Automatic test equipment architecture providing odd sector size supportADVANTEST CORP·Filed 2023·Granted Jun 17, 2025·0 cites·16 claims
- 1261US12320851B2Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socketADVANTEST CORP·Filed 2021·Granted Jun 3, 2025·0 cites·20 claims
- 1357US11650893B2Multiple name space test systems and methodsADVANTEST CORP·Filed 2021·Granted May 16, 2023·0 cites·19 claims
- 1456US11899550B2Enhanced auxiliary memory mapped interface test systems and methodsADVANTEST CORP·Filed 2021·Granted Feb 13, 2024·0 cites·17 claims
- 1555US12222844B2Systems and methods for testing virtual functions of a device under testADVANTEST CORP·Filed 2023·Granted Feb 11, 2025·0 cites·21 claims
- 1644US2022382668A1Systems and methods for concurrent and automated testing of zoned namespace solid state drivesADVANTEST CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →