Inventor · disambiguated record
Claudian Nicolesco
Also filed as: NICOLESCO CLAUDIAN · NICOLESCO CLAUDIAN R
1 granted patent·3 pending applications·39 citations·filing 1999–2002
47Inventor score
Top patents by PatentIndex Score
4 records- 0160US6147357AApparatus and method for inspecting the edge micro-texture of a semiconductor waferWACKER SILTRONIC CORP·Filed 1999·Granted Nov 14, 2000·39 cites·13 claims
- 0229US2002164876A1Method for finishing polysilicon or amorphous substrate structuresFiled 2002·Application pending·0 cites
- 0328US2003060020A1Method and apparatus for finishing substrates for wafer to wafer bondingSILICON EVOLUTION INC·Filed 2001·Application pending·0 cites
- 0427US2002187595A1Methods for silicon-on-insulator (SOI) manufacturing with improved control and site thickness variations and improved bonding interface qualitySILICON EVOLUTION INC·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →