Inventor · disambiguated record

Clint Vander Giessen

Also filed as: Vander Giessen Clint

1 granted patent·1 citations·filing 2017–2017

14Inventor score

Technology areasG01R

Files withCASCADE MICROTECH INC1

Top patents by PatentIndex Score

1 record

0156US10060963B2Probe systems, storage media, and methods for wafer-level testing over extended temperature rangesCASCADE MICROTECH INC·Filed 2017·Granted Aug 28, 2018·1 cites·21 claims

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