Inventor · disambiguated record
Cornelis Sander Kooijman
Also filed as: KOOIJMAN CORNELIS S · KOOIJMAN CORNELIS SANDER · KOOIJMAN CORNELIS SANDER KEES
29 granted patents·2 pending applications·352 citations·filing 1990–2019
97Inventor score
Files withFEI CO15PHILIPS CORP5BOUGHORBEL FAYSAL3KOOIJMAN CORNELIS SANDER3BIERHOFF MARTINUS PETRUS MARIA2
Top patents by PatentIndex Score
31 records- 0195US8232523B2SEM imaging methodBOUGHORBEL FAYSAL·Filed 2011·Granted Jul 31, 2012·41 cites·20 claims
- 0294US8581189B2Charged particle microscopy imaging methodBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 12, 2013·18 cites·20 claims
- 0394US8334512B2Detector system for use with transmission electron microscope spectroscopyLUECKEN UWE·Filed 2011·Granted Dec 18, 2012·26 cites·16 claims
- 0493US9620330B2Mathematical image assembly in a scanning-type microscopeFEI CO·Filed 2015·Granted Apr 11, 2017·15 cites·20 claims
- 0593US8586921B2Charged-particle microscope providing depth-resolved imageryBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 19, 2013·19 cites·17 claims
- 0692US8748816B2Clustering of multi-modal dataKOOIJMAN CORNELIS SANDER·Filed 2012·Granted Jun 10, 2014·20 cites·20 claims
- 0792US7906762B2Compact scanning electron microscopeFEI CO·Filed 2007·Granted Mar 15, 2011·25 cites·16 claims
- 0891US8450820B2Radiation detectorNANVER LIS KAREN·Filed 2011·Granted May 28, 2013·45 cites·19 claims
- 0991US8309921B2Compact scanning electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2011·Granted Nov 13, 2012·17 cites·7 claims
- 1088US8354587B2Hermetically sealed housing with electrical feed-inFEI CO·Filed 2006·Granted Jan 15, 2013·17 cites·20 claims
- 1186US6852982B1Magnetic lensFEI CO·Filed 2003·Granted Feb 8, 2005·23 cites·22 claims
- 1280US9865427B2User interface for an electron microscopeFEI CO·Filed 2015·Granted Jan 9, 2018·2 cites·16 claims
- 1378US8314409B2Pattern modification schemes for improved FIB patterningMILLER TOM·Filed 2010·Granted Nov 20, 2012·6 cites·15 claims
- 1472US5401979AMethods for investigating an object by means of a reflectable radiation beam and devices suitable for carrying out the methods having an image sensor rigidly interconnected with an optical detectorPHILIPS CORP·Filed 1993·Granted Mar 28, 1995·31 cites·12 claims
- 1571US8288724B2Dark field detector for use in an electron microscopeKOOIJMAN CORNELIS SANDER·Filed 2009·Granted Oct 16, 2012·3 cites·13 claims
- 1670US9025018B2User interface for an electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2007·Granted May 5, 2015·2 cites·21 claims
- 1769US8941072B2Silicon drift diode detector configured to switch between pulse height measurement mode and current measurement modeKOOIJMAN CORNELIS SANDER·Filed 2012·Granted Jan 27, 2015·1 cites·14 claims
- 1864US9361275B2Method for analyzing an EDS signalFEI CO·Filed 2013·Granted Jun 7, 2016·2 cites·18 claims
- 1963US10002742B2Composite scan path in a charged particle microscopeFEI CO·Filed 2015·Granted Jun 19, 2018·1 cites·15 claims
- 2055US10692691B2Pulse processingFEI CO·Filed 2019·Granted Jun 23, 2020·0 cites·20 claims
- 2151US8624206B2Pattern modification schemes for improved FIB patterningFEI CO·Filed 2012·Granted Jan 7, 2014·0 cites·14 claims
- 2247US5136192AHigh speed measuring device utilizing logarithmic conversionPHILIPS CORP·Filed 1990·Granted Aug 4, 1992·10 cites·5 claims
- 2346US10403470B2Pulse processingFEI CO·Filed 2016·Granted Sep 3, 2019·0 cites·20 claims
- 2446US5252864ANormalization circuit for a measuring devicePHILIPS CORP·Filed 1991·Granted Oct 12, 1993·9 cites·19 claims
- 2541US9812287B2Charged particle microscope with improved spectroscopic functionalityFEI CO·Filed 2015·Granted Nov 7, 2017·0 cites·19 claims
- 2640US5512760AOptical height detector with coaxial irradiation and image axes and plural detectors spaced along the image axisPHILIPS CORP·Filed 1994·Granted Apr 30, 1996·9 cites·16 claims
- 2737US9502211B1Adaptive scanning for particle size using directed beam signal analysisFEI CO·Filed 2015·Granted Nov 22, 2016·0 cites·20 claims
- 2837US2016056015A1Radiation Sensor, and its Application in a Charged-Particle MicroscopeFEI CO·Filed 2015·Application pending·0 cites
- 2935US5421506AMethod of positioning an object on a carrierPHILIPS CORP·Filed 1993·Granted Jun 6, 1995·10 cites·6 claims
- 3032US2015279615A1Imaging a Sample with Multiple Beams and Multiple DetectorsFEI CO·Filed 2015·Application pending·0 cites
- 3131US8707461B2Scanning method for scanning a sample with a probeFEI CO·Filed 2012·Granted Apr 22, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →