Inventor · disambiguated record
Concetta Riccobene
Also filed as: RICCOBENE CONCETTA · RICCOBENE CONCETTA E
15 granted patents·2 pending applications·491 citations·filing 1999–2017
94Inventor score
Top patents by PatentIndex Score
17 records- 0197US6410371B1Method of fabrication of semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layerADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 25, 2002·163 cites·13 claims
- 0288US6765227B1Semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer and method of fabrication using wafer bondingADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 20, 2004·43 cites·13 claims
- 0384US6515333B1Removal of heat from SOI deviceADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 4, 2003·35 cites·9 claims
- 0484US6391767B1Dual silicide process to reduce gate resistanceADVANCED MICRO DEVICES INC·Filed 2000·Granted May 21, 2002·35 cites·16 claims
- 0578US6479868B1Silicon-on-insulator transistors with asymmetric source/drain junctions formed by angled germanium implantationADVANCED MICRO DEVICES INC·Filed 2001·Granted Nov 12, 2002·27 cites·9 claims
- 0678US6242329B1Method for manufacturing asymmetric channel transistorADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 5, 2001·57 cites·8 claims
- 0776US6525378B1Raised S/D region for optimal silicidation to control floating body effects in SOI devicesADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 25, 2003·23 cites·28 claims
- 0874US6667512B1Asymmetric retrograde halo metal-oxide-semiconductor field-effect transistor (MOSFET)ADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 23, 2003·17 cites·13 claims
- 0973US6538284B1SOI device with body recombination region, and methodADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 25, 2003·18 cites·14 claims
- 1066US6229184B1Semiconductor device with a modulated gate oxide thicknessADVANCED MICRO DEVICES INC·Filed 1999·Granted May 8, 2001·32 cites·20 claims
- 1159US6548335B1Selective epitaxy to reduce gate/gate dielectric interface roughnessADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 15, 2003·8 cites·10 claims
- 1256US6717212B2Leaky, thermally conductive insulator material (LTCIM) in semiconductor-on-insulator (SOI) structureADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 6, 2004·5 cites·8 claims
- 1356US6396103B1Optimized single side pocket implant location for a field effect transistorADVANCED MICRO DEVICES INC·Filed 1999·Granted May 28, 2002·21 cites·8 claims
- 1451US6475816B1Method for measuring source and drain junction depth in silicon on insulator technologyADVANCED MICRO DEVICES INC·Filed 2001·Granted Nov 5, 2002·3 cites·9 claims
- 1547US6274501B1Formation of structure to accurately measure source/drain resistanceADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 14, 2001·4 cites·10 claims
- 1638US2017287752A1Integrated metrology and process tool to enable local stress/overlay correctionAPPLIED MATERIALS INC·Filed 2017·Application pending·0 cites
- 1733US2014169113A1Enhancing Memory Yield Through Memory Subsystem RepairLSI CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →