Inventor · disambiguated record
David R. Bakker
Also filed as: BAKKER DAVID R
3 granted patents·79 citations·filing 2002–2003
73Inventor score
Files withKLA TENCOR TECH CORP3
Top patents by PatentIndex Score
3 records- 0180US7283659B1Apparatus and methods for searching through and analyzing defect images and wafer mapsKLA TENCOR TECH CORP·Filed 2002·Granted Oct 16, 2007·51 cites·41 claims
- 0273US6952653B2Single tool defect classification solutionKLA TENCOR TECH CORP·Filed 2003·Granted Oct 4, 2005·18 cites·23 claims
- 0368US6770879B1Motion picture output from electron microscopeKLA TENCOR TECH CORP·Filed 2003·Granted Aug 3, 2004·10 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →