Inventor · disambiguated record
Daniel Kwadwo Amponsah Berkoh
Also filed as: BERKOH DANIEL K · BERKOH DANIEL KWADWO AMPONSAH
9 granted patents·4 pending applications·56 citations·filing 2010–2018
87Inventor score
Top patents by PatentIndex Score
13 records- 0193US8357263B2Apparatus and methods for electrical measurements in a plasma etcherSKYWORKS SOLUTIONS INC·Filed 2010·Granted Jan 22, 2013·28 cites·12 claims
- 0286US9576838B2Devices for methodologies related to wafer carriersSKYWORKS SOLUTIONS INC·Filed 2015·Granted Feb 21, 2017·4 cites·20 claims
- 0385US9905484B2Methods for shielding a plasma etcher electrodeSKYWORKS SOLUTIONS INC·Filed 2016·Granted Feb 27, 2018·4 cites·20 claims
- 0485US9711364B2Methods for etching through-wafer vias in a waferSKYWORKS SOLUTIONS INC·Filed 2014·Granted Jul 18, 2017·6 cites·20 claims
- 0584US9865491B2Devices for methodologies related to wafer carriersSKYWORKS SOLUTIONS INC·Filed 2017·Granted Jan 9, 2018·3 cites·20 claims
- 0683US10083838B2Methods of measuring electrical characteristics during plasma etchingSKYWORKS SOLUTIONS INC·Filed 2017·Granted Sep 25, 2018·3 cites·20 claims
- 0781US10453697B2Methods of measuring electrical characteristics during plasma etchingSKYWORKS SOLUTIONS INC·Filed 2018·Granted Oct 22, 2019·2 cites·20 claims
- 0878US9478428B2Apparatus and methods for shielding a plasma etcher electrodeBERKOH DANIEL K·Filed 2010·Granted Oct 25, 2016·6 cites·40 claims
- 0948US2018286768A1Methods for optical endpoint detection using an endpoint boosterSKYWORKS SOLUTIONS INC·Filed 2018·Application pending·0 cites
- 1048US2018197797A1Endpoint booster systemsSKYWORKS SOLUTIONS INC·Filed 2017·Application pending·0 cites
- 1147US9870963B2Endpoint booster systems and methods for optical endpoint detectionSKYWORKS SOLUTIONS INC·Filed 2015·Granted Jan 16, 2018·0 cites·20 claims
- 1247US2012080832A1Devices for methodologies related to wafer carriersWOODARD ELENA B·Filed 2011·Application pending·0 cites
- 1342US2012083129A1Apparatus and methods for focusing plasmaBERKOH DANIEL K·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →