Inventor · disambiguated record
David Berman
Also filed as: BERMAN DAVID · BERMAN DAVID A · BERMAN DAVID H
18 granted patents·4 pending applications·502 citations·filing 2001–2012
96Inventor score
Files withJORDAN VALLEY APPLIED RADIATION LTD8JORDAN VALLEY SEMICONDUCTORS5YOKHIN BORIS2BERMAN DAVID A1BERMAN DAVID H1
Top patents by PatentIndex Score
22 records- 0197US7406153B2Control of X-ray beam spot sizeJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jul 29, 2008·57 cites·26 claims
- 0296US6512814B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2001·Granted Jan 28, 2003·90 cites·5 claims
- 0395US6639968B2X-ray reflectometerJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Oct 28, 2003·71 cites·31 claims
- 0493US8687766B2Enhancing accuracy of fast high-resolution X-ray diffractometryWORMINGTON MATTHEW·Filed 2011·Granted Apr 1, 2014·27 cites·18 claims
- 0593US8437450B2Fast measurement of X-ray diffraction from tilted layersWALL JOHN·Filed 2010·Granted May 7, 2013·23 cites·16 claims
- 0693US8243878B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2010·Granted Aug 14, 2012·22 cites·42 claims
- 0793US7653174B2Inspection of small features using X-ray fluorescenceJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Jan 26, 2010·29 cites·12 claims
- 0892US7600916B2Target alignment for X-ray scattering measurementsJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Oct 13, 2009·21 cites·20 claims
- 0991US7130376B2X-ray reflectometry of thin film layers with enhanced accuracyJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Oct 31, 2006·17 cites·34 claims
- 1088US8731138B2High-resolution X-ray diffraction measurement with enhanced sensitivityYOKHIN BORIS·Filed 2012·Granted May 20, 2014·8 cites·16 claims
- 1188US7068753B2Enhancement of X-ray reflectometry by measurement of diffuse reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jun 27, 2006·28 cites·21 claims
- 1286US7231016B2Efficient measurement of diffuse X-ray reflectionsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jun 12, 2007·9 cites·16 claims
- 1386US6947520B2Beam centering and angle calibration for X-ray reflectometryJORDAN VALLEY APPLIED RADIATION LTD·Filed 2002·Granted Sep 20, 2005·27 cites·42 claims
- 1484US7062013B2X-ray reflectometry of thin film layers with enhanced accuracyJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted Jun 13, 2006·24 cites·14 claims
- 1583US7453985B2Control of X-ray beam spot sizeJORDAN VALLEY SEMICONDUCTORS·Filed 2007·Granted Nov 18, 2008·7 cites·17 claims
- 1681US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 1780US6895071B2XRR detector readout processingJORDON VALLEY APPLIED RADIATIO·Filed 2003·Granted May 17, 2005·23 cites·17 claims
- 1873US7474732B2Calibration of X-ray reflectometry systemJORDAN VALLEY APPLIED RADIATION LTD·Filed 2004·Granted Jan 6, 2009·12 cites·108 claims
- 1951US2009124952A1Herpes Treatment and DressingBERMAN DAVID A·Filed 2008·Application pending·0 cites
- 2050US2007130668A1Patient gownBERMAN DAVID H·Filed 2005·Application pending·0 cites
- 2146US2007274447A1Automated selection of X-ray reflectometry measurement locationsMAZOR ISAAC·Filed 2007·Application pending·0 cites
- 2243US2014031664A1Radiographic imaging deviceKANG HYOSIG·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →