Inventor · disambiguated record
David L. Brown
Also filed as: BROWN DAVID L · BROWN DAVID LYNDELL
8 granted patents·5 pending applications·71 citations·filing 2001–2024
83Inventor score
Top patents by PatentIndex Score
13 records- 0193US7260984B2Power generation utilizing tire pressure changesLV SENSORS INC·Filed 2005·Granted Aug 28, 2007·41 cites·29 claims
- 0291US7775810B2Voltage tap apparatus for series connected conductive case battery cellsDELPHI TECH INC·Filed 2008·Granted Aug 17, 2010·13 cites·11 claims
- 0380US9659139B2Approach for performing improved timing analysis with improved accuracyNVIDIA CORP·Filed 2015·Granted May 23, 2017·4 cites·21 claims
- 0469US12484316B2CVD boron uniformity overcoming loading effectsKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·29 claims
- 0563US11719533B2Modulation of scanning velocity during overlay metrologyKLA CORP·Filed 2021·Granted Aug 8, 2023·0 cites·26 claims
- 0662US2025072139A1Biasing and readout methods for high-speed resistive gate sensorKLA CORP·Filed 2024·Application pending·0 cites
- 0761US6851175B2Wound stator core and method of makingDELPHI TECH INC·Filed 2001·Granted Feb 8, 2005·11 cites·10 claims
- 0847US2024296274A1Logic cell placement mechanisms for improved clock on-chip variationNVIDIA CORP·Filed 2023·Application pending·0 cites
- 0945US2015234963A1Interface analysis for verification of digital circuitsNVIDIA CORP·Filed 2014·Application pending·0 cites
- 1042US6624056B2Methods and apparatus for providing improved physical designs and routing with reduced capacitive power dissipationPTS CORP·Filed 2001·Granted Sep 23, 2003·2 cites·17 claims
- 1140US9830419B2Modifying implant regions in an integrated circuit to meet minimum width design rulesNVIDIA CORP·Filed 2015·Granted Nov 28, 2017·0 cites·22 claims
- 1238US2005046299A1Windings for electric machinesFiled 2003·Application pending·0 cites
- 1337US2003197443A1Stator core and method of makingFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →