Inventor · disambiguated record
Danny R. Cline
Also filed as: CLINE DANNY R
17 granted patents·1 pending application·531 citations·filing 1990–2006
95Inventor score
Files withTEXAS INSTRUMENTS INC17
Top patents by PatentIndex Score
18 records- 0189US5841707AApparatus and method for a programmable interval timing generator in a semiconductor memoryTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 24, 1998·78 cites·1 claims
- 0288US6801461B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 5, 2004·39 cites·42 claims
- 0387US5883843ABuilt-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 16, 1999·68 cites·6 claims
- 0481US6014336ATest enable control for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 11, 2000·47 cites·55 claims
- 0575US5309446ATest validation method for a semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1992·Granted May 3, 1994·40 cites·7 claims
- 0673US7328388B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2006·Granted Feb 5, 2008·4 cites·6 claims
- 0771US5923599AApparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unitTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 13, 1999·30 cites·12 claims
- 0870US7278078B2Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 2, 2007·12 cites·19 claims
- 0969US6353563B1Built-in self-test arrangement for integrated circuit memory devicesTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 5, 2002·55 cites·43 claims
- 1064US5875153AInternal/external clock option for built-in self testTEXAS INSTRUMENTS INC·Filed 1998·Granted Feb 23, 1999·43 cites·12 claims
- 1162US5991213AShort disturb test algorithm for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Nov 23, 1999·29 cites·23 claims
- 1259US5953272AData invert jump instruction test for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 14, 1999·18 cites·10 claims
- 1357US5220534ASubstrate bias generator systemTEXAS INSTRUMENTS INC·Filed 1990·Granted Jun 15, 1993·25 cites·19 claims
- 1454US6438718B1Wordline stress mode arrangement a storage cell initialization scheme test time reduction burn-in eliminationTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 20, 2002·15 cites·10 claims
- 1552US5959912AROM embedded mask release number for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 28, 1999·13 cites·2 claims
- 1640US5742614AApparatus and method for a variable step address generatorTEXAS INSTRUMENTS INC·Filed 1996·Granted Apr 21, 1998·12 cites·18 claims
- 1735US6002286AApparatus and method for a programmable interval timing generator in a semiconductor memoryTEXAS INSTRUMENTS INC·Filed 1998·Granted Dec 14, 1999·3 cites·3 claims
- 1833US2002071325A1Built-in self-test arrangement for integrated circuit memory devicesFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →