Inventor · disambiguated record
David J. Collins
Also filed as: COLLINS DAVID · COLLINS DAVID J · COLLINS DAVID JAMES
10 granted patents·3 pending applications·288 citations·filing 1977–2024
91Inventor score
Files withXEROX CORP4GEN ELECTRIC3ANALOG DEVICES INC2APPLIED MATERIALS INC1SEMICONDUCTOR COMPONENTS IND LLC1
Top patents by PatentIndex Score
13 records- 0192US6352935B1Method of forming a cover cap for semiconductor wafer devicesANALOG DEVICES INC·Filed 2000·Granted Mar 5, 2002·84 cites·29 claims
- 0279US6893574B2MEMS capping method and apparatusANALOG DEVICES INC·Filed 2001·Granted May 17, 2005·31 cites·14 claims
- 0378US5668061AMethod of back cutting silicon wafers during a dicing procedureXEROX CORP·Filed 1995·Granted Sep 16, 1997·49 cites·6 claims
- 0475US5218381AHydrophobic coating for a front face of a printhead in an ink jet printerXEROX CORP·Filed 1992·Granted Jun 8, 1993·31 cites·20 claims
- 0566US5368683AMethod of fabricating ink jet printheadsXEROX CORP·Filed 1993·Granted Nov 29, 1994·26 cites·9 claims
- 0663US4302963AThrust bearing wear detector positionerGEN ELECTRIC·Filed 1980·Granted Dec 1, 1981·19 cites·9 claims
- 0760US5545283AApparatus for bonding wafer pairsXEROX CORP·Filed 1995·Granted Aug 13, 1996·26 cites·16 claims
- 0857US11819847B2Nanofluidic device with silicon nitride membraneAPPLIED MATERIALS INC·Filed 2020·Granted Nov 21, 2023·0 cites·20 claims
- 0953US2025358537A1Reset gate for photodiodeSEMICONDUCTOR COMPONENTS IND LLC·Filed 2024·Application pending·0 cites
- 1039US4412780ARate initial pressure limiterGEN ELECTRIC·Filed 1981·Granted Nov 1, 1983·17 cites·10 claims
- 1138US4073184AShaft axial position monitoring systemGEN ELECTRIC·Filed 1977·Granted Feb 14, 1978·5 cites·8 claims
- 1236US2006115958A1Method and apparatus for forming buried oxygen precipitate layers in multi-layer wafersWEIGOLD JASON W·Filed 2005·Application pending·0 cites
- 1333US2004104444A1MEMS device with alternative electrical connectionsWACHTMANN BRUCE K·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →